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Hard X-ray Photoelectron Spectroscopy

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Photoelectron Spectroscopy

Part of the book series: Springer Series in Surface Sciences ((SSSUR,volume 72))

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Abstract

In order to realize as high bulk sensitivity as possible in PES studies of strongly correlated electron systems (SCES materials), hard X-ray photoelectron spectroscopy (HAXPES) at \( \text{h}\nu \) and EK above ~ a few keV is now recognized to be inevitable in spite of rather low count rates compared with PES and ARPES even in the soft X-ray region.

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Authors and Affiliations

  1. The Institute of Scientific and Industrial Research, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka, 567-0047, Japan

    Shigemasa Suga

  2. Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama, Toyonaka, Osaka, 560-8531, Japan

    Akira Sekiyama

  3. Peter Grünberg Institut (PGI-6), Forschungszentrum Jülich, Jülich, Germany

    Christian Tusche

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  1. Shigemasa Suga
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Suga, S., Sekiyama, A., Tusche, C. (2021). Hard X-ray Photoelectron Spectroscopy. In: Photoelectron Spectroscopy. Springer Series in Surface Sciences, vol 72. Springer, Cham. https://doi.org/10.1007/978-3-030-64073-6_8

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