Abstract
This chapter details the tests and analysis performed on the different ANN models. These models differ by the format of their input vector or by the loss function used during training, while the network’s architecture is kept the same. The objective is to compare the impact of these key parts of the model.
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Gusmão, A., Horta, N., Lourenço, N., Martins, R. (2020). Results. In: Analog IC Placement Generation via Neural Networks from Unlabeled Data. SpringerBriefs in Applied Sciences and Technology. Springer, Cham. https://doi.org/10.1007/978-3-030-50061-0_5
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DOI: https://doi.org/10.1007/978-3-030-50061-0_5
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