This chapter presents a brief introduction on the problematic addressed by this book, namely the impact of variability effects at nanometer-scale technology nodes and how an early prediction of the yield helps improving analog integrated circuits production cycles. Additionally, the main goals for the work presented in this book as well as the document’s structure are also highlighted in this chapter.


Analog IC design Electronic design automation Parametric yield Monte Carlo analysis 


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© Springer Nature Switzerland AG 2020

Authors and Affiliations

  1. 1.Instituto Superior TécnicoInstituto de TelecomunicaçõesLisbonPortugal
  2. 2.Instituto Politécnico de TomarInstituto de TelecomunicaçõesLisbonPortugal

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