Abstract
This chapter presents a brief introduction on the problematic addressed by this book, namely the impact of variability effects at nanometer-scale technology nodes and how an early prediction of the yield helps improving analog integrated circuits production cycles. Additionally, the main goals for the work presented in this book as well as the document’s structure are also highlighted in this chapter.
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Canelas, A.M.L., Guilherme, J.M.C., Horta, N.C.G. (2020). Introduction. In: Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies. Springer, Cham. https://doi.org/10.1007/978-3-030-41536-5_1
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DOI: https://doi.org/10.1007/978-3-030-41536-5_1
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