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Electron–Induced Domain

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Near-Field-Mediated Photon–Electron Interactions

Part of the book series: Springer Series in Optical Sciences ((SSOS,volume 228))

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Abstract

EELS and CL have been introduced as efficient tools for probing nanooptical excitations in single nanostructures, with a nanometre spatial resolution and meV energy resolution. Thanks to the ultrafast interaction of localized relativistic electrons with the optical modes of nanostructures in TEMs, electron beams appear as an ultra-broadband probe of sample resonances. The inelastic interaction of a swift electron with nanostructures can be understood using a useful classical approach, as discussed in the previous chapter, that has been proven to be identical to the quantum-mechanical treatment when averaging over electron impact parameters weighted by the spot intensity (Ritchie and Howie in Philos Mag A 58(5):753–767, 1988 [3]).

Portions of the text of this chapter have been re-published with permission from [1], re-printed under the CC BY license; [2], re-printed under the CC BY license.

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Authors and Affiliations

  1. Stuttgart Center for Electron Microscopy (StEM), Max Planck Institute for Solid State Research, Stuttgart, Baden-Württemberg, Germany

    Nahid Talebi

  2. Institute of Experimental and Applied Physics, Christian-Albrechts University in Kiel, Kiel, Germany

    Nahid Talebi

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  1. Nahid Talebi
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Correspondence to Nahid Talebi .

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Talebi, N. (2019). Electron–Induced Domain. In: Near-Field-Mediated Photon–Electron Interactions. Springer Series in Optical Sciences, vol 228. Springer, Cham. https://doi.org/10.1007/978-3-030-33816-9_4

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