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Advanced Computing in Electron Microscopy pp 143–195Cite as

Theory of Calculation of Images of Thick Specimens

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Abstract

This chapter describes the theory of calculating transmission electron microscope image of thick specimens (more than a few atoms thick), including the effects of multiple (or plural) scattering. Two popular methods are presented: Bloch wave methods and multislice methods. These approximations are typically good for specimens up to a few thousand Angstroms thick.

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  1. School of Applied & Engineering Physics, Cornell University, Ithaca, NY, USA

    Earl J. Kirkland

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Kirkland, E.J. (2020). Theory of Calculation of Images of Thick Specimens. In: Advanced Computing in Electron Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-030-33260-0_6

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