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The Transmission Electron Microscope

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Advanced Computing in Electron Microscopy

Abstract

This chapter gives a short description of the physical instrumentation of the transmission electron microscope (fixed beam and scanned probe modes). It starts with the fundamental physics of electron dynamics for energies in the range 60–1000 keV. Some types of magnetic lenses and aberration correctors used to focus the electrons in the microscope are discussed. Various approximations used in modeling the microscope are introduced. Optical aberrations are defined, and general methods of aberration correction are described briefly.

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    Earl J. Kirkland

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Kirkland, E.J. (2020). The Transmission Electron Microscope. In: Advanced Computing in Electron Microscopy. Springer, Cham. https://doi.org/10.1007/978-3-030-33260-0_2

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