Abstract
The elastic coupling in multiferroic materials and even more so in magnetoelectric composites plays an important role for the properties and function. In this study, the electrically induced strain at the epitaxial interface of 0.72Pb(Mn1/3Nb2/3)O3–0.28PbTiO3—CoFe2O4, a magnetoelectric composite, is characterized by in situ X-ray scattering experiment and transmission electron microscopy study. For the measured range all strain induced lattice changes are reversible ruling out plastic deformation. The surprisingly non-perfect elastic coupling of 87 ± 7% in this epitaxial system can be explained by the presence of planar defects in the CFO film.
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Acknowledgements
We acknowledge the financial support provided via SFB855, PAK902 & SFB1261 (Deutsche Forschungsgemeinschaft) and the ERA.Net RUS project NANO-C (STProjects-133). We thank DESY and the Diamond Light Source for access and the staff of P08 and I16 for the support during the experiments.
Conflict of Interest The authors declare that they have no conflict of interest.
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Koops, C.T. et al. (2020). Elastic Coupling at Epitaxial Multiferroic Interfaces: In Situ X-Ray Studies of Electric Field Induced Strain. In: Tiginyanu, I., Sontea, V., Railean, S. (eds) 4th International Conference on Nanotechnologies and Biomedical Engineering. ICNBME 2019. IFMBE Proceedings, vol 77. Springer, Cham. https://doi.org/10.1007/978-3-030-31866-6_38
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