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Elastic Coupling at Epitaxial Multiferroic Interfaces: In Situ X-Ray Studies of Electric Field Induced Strain

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Book cover 4th International Conference on Nanotechnologies and Biomedical Engineering (ICNBME 2019)

Part of the book series: IFMBE Proceedings ((IFMBE,volume 77))

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Abstract

The elastic coupling in multiferroic materials and even more so in magnetoelectric composites plays an important role for the properties and function. In this study, the electrically induced strain at the epitaxial interface of 0.72Pb(Mn1/3Nb2/3)O3–0.28PbTiO3—CoFe2O4, a magnetoelectric composite, is characterized by in situ X-ray scattering experiment and transmission electron microscopy study. For the measured range all strain induced lattice changes are reversible ruling out plastic deformation. The surprisingly non-perfect elastic coupling of 87 ± 7% in this epitaxial system can be explained by the presence of planar defects in the CFO film.

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References

  1. Eerenstein, W., Mathur, N.D., Scott, J.F.: Nature 442, 759 (2006)

    Article  Google Scholar 

  2. Bibes, M., Barthélémy, A.: Nat. Mater. 7, 425 (2008)

    Article  Google Scholar 

  3. Eerenstein, W., Wiora, M., Prieto, J.L., Scott, J.F., Mathur, N.D.: Nat. Mater. 6, 348 (2007)

    Article  Google Scholar 

  4. Röbisch, V., Salzer, S., Urs, N., Reermann, J., Yarar, E., Piorra, A., Kirchhof, C., Lage, E., Höft, M., Schmidt, G., et al.: J. Mater. Res. 32, 1009 (2017)

    Article  Google Scholar 

  5. Sahoo, S., Polisetty, S., Duan, C.-G., Jaswal, S.S., Tsymbal, E.Y., Binek, C.: Phys. Rev. B 76, 092108 (2007)

    Article  Google Scholar 

  6. Liverts, E., Grosz, A., Zadov, B., Bichurin, M.I., Pukinskiy, Y.J., Priya, S., Viehland, D., Paperno, E.: J. Appl. Phys. 109, 07D703 (2011)

    Article  Google Scholar 

  7. Zhu, M., Nan, T., Peng, B., Zhang, Y., Zhou, Z., Yang, X., Ren, W., Sun, N., Liu, M.: IEEE Trans. Magn. 53, 1 (2017)

    Article  Google Scholar 

  8. Zheng, R., Wang, Y., Liu, Y., Gao, G., Fei, L., Jiang, Y., Chan, H., Li, X., Luo, H., Li, X.: Mater. Chem. Phys. 133, 42 (2012)

    Article  Google Scholar 

  9. Bellaiche, L., Vanderbilt, D.: Phys. Rev. Lett. 83, 1347 (1999)

    Article  Google Scholar 

  10. Zhang, S.J., Lee, S.M., Kim, D.H., Lee, H.Y., Shrout, T.R.: J. Am. Ceram. Soc. 91, 683 (2008)

    Article  Google Scholar 

  11. Wang, Z., Viswan, R., Hu, B., Li, J., Harris, V., Viehland, D.: J. Appl. Phys. 111, 034108 (2012)

    Article  Google Scholar 

  12. Bozorth, R.M., Tilden, E.F., Williams, A.J.: Phys. Rev. 99, 1788 (1955)

    Article  Google Scholar 

  13. Zhang, R., Jiang, B., Cao, W.: J. Appl. Phys. 90, 3471 (2001)

    Article  Google Scholar 

  14. Bai, F., Wang, N., Li, J., Viehland, D., Gehring, P., Xu, G., Shirane, G.: J. Appl. Phys. 96, 1620 (2004)

    Article  Google Scholar 

  15. Abes, M., Koops, C.T., Hrkac, S.B., Greve, H., Quandt, E., Collins, S.P., Murphy, B.M., Magnussen, O.M.: Appl. Phys. Lett. 102, 011601 (2013)

    Article  Google Scholar 

  16. Dosch, H.: Critical Phenomena at Surfaces and Interfaces—Evanescent X-Ray and Neutron Scattering, Springer Tracts in Modern Physics, vol. 126. Springer (1992)

    Google Scholar 

  17. Kilaas, R.: J. Microsc. 190, 45 (1998)

    Article  Google Scholar 

  18. Abes, M., Koops, C., Hrkac, S., McCord, J., Urs, N., Wolff, N., Kienle, L., Ren, W., Bouchenoire, L., Murphy, B., Magnussen, O.M.: Phys. Rev. B 93, 195427 (2016)

    Article  Google Scholar 

  19. Dörr, K., Nilani-Zeneli, O., Herklotz, A., Rata, A.D., Boldyreva, K., Kim, J.-W., Dekker, M.C., Nenkov, K., Schultz, L., Reibold, M.: Eur. Phys. J. B 71, 361 (2009)

    Article  Google Scholar 

  20. Weissm¨uller, J., Markmann, J., Grewer, M., Birringer, R.: Acta Mater. 59, 4366 (2011)

    Google Scholar 

  21. Fritsch, D., Ederer, C.: Phys. Rev. B 82, 104117 (2010)

    Article  Google Scholar 

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Acknowledgements

We acknowledge the financial support provided via SFB855, PAK902 & SFB1261 (Deutsche Forschungsgemeinschaft) and the ERA.Net RUS project NANO-C (STProjects-133). We thank DESY and the Diamond Light Source for access and the staff of P08 and I16 for the support during the experiments.

Conflict of Interest The authors declare that they have no conflict of interest.

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Authors and Affiliations

  1. Institute of Experimental and Applied Physics, Kiel University, 19 Leibnizstr., Kiel, Germany

    C. T. Koops, S. B. Hrkac, M. Abes, P. Jordt, J. Stettner, O. M. Magnussen & B. M. Murphy

  2. Nanoelectronics, Technical Faculty, Kiel University, Kiel, Germany

    A. Petraru & H. Kohlstedt

  3. Institute of Material Sciences, Kiel University, Kiel, Germany

    V. Hrkac, N. Wolff & L. Kienle

  4. Photon Science, DESY, Hamburg, Germany

    O. H. Seeck

  5. Diamond Light Source, Harwell Science and Innovation Campus, Didcot, UK

    G. Nisbet

  6. Ruprecht Haensel Laboratory, Kiel University, Kiel, Germany

    O. M. Magnussen & B. M. Murphy

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  1. C. T. Koops
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  2. S. B. Hrkac
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  3. M. Abes
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  4. P. Jordt
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  8. V. Hrkac
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  9. N. Wolff
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  10. L. Kienle
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  11. O. H. Seeck
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  13. O. M. Magnussen
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  14. B. M. Murphy
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Corresponding author

Correspondence to B. M. Murphy .

Editor information

Editors and Affiliations

  1. Academy of Sciences of Moldova, Chisinau, Moldova

    Ion Tiginyanu

  2. Department of Microelectronics and Biomedical Engineering, Technical University of Moldova, Chisinau, Moldova

    Victor Sontea

  3. Department of Microelectronics and Biomedical Engineering, Technical University of Moldova, Chisinau, Moldova

    Serghei Railean

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Koops, C.T. et al. (2020). Elastic Coupling at Epitaxial Multiferroic Interfaces: In Situ X-Ray Studies of Electric Field Induced Strain. In: Tiginyanu, I., Sontea, V., Railean, S. (eds) 4th International Conference on Nanotechnologies and Biomedical Engineering. ICNBME 2019. IFMBE Proceedings, vol 77. Springer, Cham. https://doi.org/10.1007/978-3-030-31866-6_38

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  • DOI: https://doi.org/10.1007/978-3-030-31866-6_38

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-31865-9

  • Online ISBN: 978-3-030-31866-6

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