Abstract
The quest of nanotechnology can be divided in two essential parts: the continuing down sizing of the systems of interests on one hand, and the hope of discovery of novel properties appearing at the nanoscale on the other hand. Both trends coexisted since the early times of nanoscale research with, for example, the invention of Scanning Tunneling Microscopy (STM) [1], which enables materials study and manipulation at the atomic level, and the discovery of electronic properties of silicon paving the way for our contemporary computer era.
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Spièce, J. (2019). Introduction. In: Quantitative Mapping of Nanothermal Transport via Scanning Thermal Microscopy. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-030-30813-1_1
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DOI: https://doi.org/10.1007/978-3-030-30813-1_1
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