Test Cases for Power-MOS Devices and RF-Circuitry

Janssen, Rick; Gillon, Renaud; Wieers, Aarnout; Deleu, Frederik; Guegnaud, Hervé; Reynier, Pascal; Schoenmaker, Wim; ter Maten, E. Jan W.

doi:10.1007/978-3-030-30726-4_20

Rick Janssen¹⁷,
Renaud Gillon¹⁸,
Aarnout Wieers¹⁸,
Frederik Deleu¹⁸,
Hervé Guegnaud¹⁹,
Pascal Reynier¹⁹,
Wim Schoenmaker²⁰ &
…
E. Jan W. ter Maten²¹

Part of the book series: Mathematics in Industry ((TECMI,volume 29))

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Abstract

This chapter gives an overview of realistic test cases, provided by industrial partners, for validation of the simulation tools, that were developed in the last years. They allowed to compare the results of measurements and simulations for real-life size applications.

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Authors and Affiliations

NXP Semiconductors, Eindhoven, the Netherlands
Rick Janssen
ON Semiconductor Belgium BVBA, Oudenaarde, Belgium
Renaud Gillon, Aarnout Wieers & Frederik Deleu
ACCO Semiconductor, Louveciennes, France
Hervé Guegnaud & Pascal Reynier
MAGWEL NV, Leuven, Belgium
Wim Schoenmaker
Bergische Universität Wuppertal, Wuppertal, Germany
E. Jan W. ter Maten

Authors

Rick Janssen
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Renaud Gillon
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Aarnout Wieers
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Frederik Deleu
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Hervé Guegnaud
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Pascal Reynier
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Wim Schoenmaker
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E. Jan W. ter Maten
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Correspondence to Rick Janssen .

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Editors and Affiliations

Applied Mathematics & Numerical Analysis, Bergische Universität Wuppertal, Wuppertal, Germany
E. Jan W. ter Maten
Fachhochschule Oberösterreich, Wels, Austria
Hans-Georg Brachtendorf
Institute of Mathematics and Computer Science, Ernst-Moritz Universität Greifswald, Greifswald, Germany
Roland Pulch
MAGWEL NV, Leuven, Belgium
Wim Schoenmaker
TEMF, TU Darmstadt, Darmstadt, Germany
Herbert De Gersem

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Janssen, R. et al. (2019). Test Cases for Power-MOS Devices and RF-Circuitry. In: ter Maten, E., Brachtendorf, HG., Pulch, R., Schoenmaker, W., De Gersem, H. (eds) Nanoelectronic Coupled Problems Solutions. Mathematics in Industry(), vol 29. Springer, Cham. https://doi.org/10.1007/978-3-030-30726-4_20

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DOI: https://doi.org/10.1007/978-3-030-30726-4_20
Published: 07 November 2019
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-30725-7
Online ISBN: 978-3-030-30726-4
eBook Packages: Mathematics and StatisticsMathematics and Statistics (R0)

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