Skip to main content

Parametric Model Order Reduction for Electro-Thermal Coupled Problems

  • Chapter
  • First Online:
Nanoelectronic Coupled Problems Solutions

Part of the book series: Mathematics in Industry ((TECMI,volume 29))

  • 393 Accesses

Abstract

We consider automatic parametric model order reduction for electro-thermal (ET) coupled problems arising from (nano-)microelectronic simulations. We show that the PMOR method based on multi-moment matching proposed in [2] can be applied to the discretized ET models. The error bound in [6] is used to check the accuracy of the reduced models. Based on the error bound, an adaptive algorithm for computing the reduced ET models is proposed in [7]. As a result, the reduced ET models are constructed automatically and reliably. This chapter reviews the PMOR method, the error bound, the adaptive algorithm, and their applications to ET models.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

eBook
USD 16.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 69.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 99.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

Preview

Unable to display preview. Download preview PDF.

Unable to display preview. Download preview PDF.

Author information

Authors and Affiliations

Authors

Corresponding author

Correspondence to Lihong Feng .

Editor information

Editors and Affiliations

Rights and permissions

Reprints and permissions

Copyright information

© 2019 Springer Nature Switzerland AG

About this chapter

Check for updates. Verify currency and authenticity via CrossMark

Cite this chapter

Feng, L., Benner, P. (2019). Parametric Model Order Reduction for Electro-Thermal Coupled Problems. In: ter Maten, E., Brachtendorf, HG., Pulch, R., Schoenmaker, W., De Gersem, H. (eds) Nanoelectronic Coupled Problems Solutions. Mathematics in Industry(), vol 29. Springer, Cham. https://doi.org/10.1007/978-3-030-30726-4_13

Download citation

Publish with us

Policies and ethics