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Effects of Transient Faults in Integrated Circuits

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On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits

Abstract

In the context of reliable and secure integrated circuit (IC) system applications, this chapter generally discusses the effects of transient faults induced by environmental and intentional perturbation sources. The first section briefly analyzes the transient faults induced by environmental perturbation events during the IC lifetime, and the next section synthesizes the consequences of transient faults due to intentional perturbation events, which indeed create very similar transient voltage modifications in IC systems. Furthermore, the electrical-level effects of transient faults in ICs and the consequent failures arisen from the different types of transient-fault effects on synchronous circuits (clocked systems) and asynchronous circuits (clockless systems) are also detailed in the following sections.

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Authors and Affiliations

  1. Univ. Grenoble Alpes, CNRS Grenoble INP, TIMA Laboratory, Grenoble, France

    Rodrigo Possamai Bastos

  2. DFKI GmbH / Cyber-Physical Systems, Bremen, Germany

    Frank Sill Torres

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  1. Rodrigo Possamai Bastos
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  2. Frank Sill Torres
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Bastos, R.P., Torres, F.S. (2020). Effects of Transient Faults in Integrated Circuits. In: On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits. Springer, Cham. https://doi.org/10.1007/978-3-030-29353-6_1

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  • DOI: https://doi.org/10.1007/978-3-030-29353-6_1

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