Abstract
Nanotechnology, as the scientific and technological discipline dealing with the design, fabrication and application of systems whose dimensions or tolerances are in the domain of nanometers, is becoming increasingly important in many industrial and scientific areas. Nanotechnologies and nanoscience are triggered by diverse fields and applications but on the other hand, they trigger by themselves future industrial and practical solutions. One of the most important challenges observed nowadays in nanotechnology is driving the manufacturing processes to sub-nm accuracy level for critical features and positioning tasks.
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References
Bannon F, Clark J, Nguyen C (2000) High-Q HF microelectromechanical filters. IEEE J Solid-State Circuits 35(4):512–526
Barton RA, Ilic B, Van Der Zande AM, Whitney WS, McEuen PL, Parpia JM, Craighead HG (2011) High, size-dependent quality factor in an array of graphene mechanical resonators. Nano Lett 11(3):1232–1236
Belic D, Shawrav M, Gavagnin M, Stöger-Pollach M, Wanzenboeck D, Bertagnolli E (2015) Direct-write deposition and focused-electron-beam-induced purification of gold nanostructures. ACS Appl Mater Interfaces 7(4):2467–2479
Chen C, Hone J (2013) Graphene nanoelectromechanical systems. Proc IEEE 101(7):1766–1779
Chen C, Rosenblatt S, Bolotin KI, Kalb W, Kim P, Kymissis I, Hone J (2009) Performance of monolayer graphene nanomechanical resonators with electrical readout. Nat Nanotechnol 4(12):861–867
Cleland A, Roukes M (1996) Fabrication of high frequency nanometer scale mechanical resonators from bulk Si crystals. Appl Phys Lett 69:2653
Cleland A, Roukes M (1999) External control of dissipation in a nanometer-scale radiofrequency mechanical resonator. Sens Actuators A 72(3):256–261
Goniszewski S, Gallop J, Adabi M, Gajewski K, Shaforost O, Klein N, Hao L (2015) Self-supporting graphene films and their applications. IET Circuits Devices Syst Spec 9:420–427
Gotszalk T, Grabiec P, Rangelow I (2003) Calibration and examination of piezoresistive Wheatstone bridge cantilevers for scanning probe microscopy. Ultramicroscopy 97(1–4):385–389
Grabiec P, Gotszalk T, Radojewski J, Edinger K, Abedinov N, Rangelow IW (2002) SNOM/AFM microprobe integrated with piezoresistive cantilever beam for multifunctional surface analysis. Microelectron Eng 61–62:981–986
Hoeflich K, Jurczyk J, Zhang Y, Puydinger M, Goetz M, Guerra-Nunez C, Best J, Kapusta Cz, Utke I (2017) Direct electron beam writing of silver-based nanostructures. ACS Appl Mater Interfaces 9:24071–24077
Huang S, Stott A, Green R, Beck M (1988) Electronic transducer for measurement of low value capacitances. J Phys E: Sci Instrum 21:242
Huang X, Zorman C, Mehregany M, Roukes M (2003) Nanoelectromechanical systems: nanodevice motion at microwave frequencies. Nature 421:6922
Huth M (2010) Granular metals: from electronic correlations to strain-sensing applications. J Appl Phys 107:113709
Ko WH (2007) Trends and frontiers of MEMS. Sens Actuators A 136(1):62–67
Koops H, Fukuda H (2016) Giant current density via indirect exciton orbit overlapping in polarized nano-granular materials. J Vac Sci Technol 33(2):02B108
Lewis B, Mound B, Srijanto B, Fowlkes J, Pharr G, Rack P (2017) Growth and nanomechanical characterization of nanoscale 3D architectures grown via focused electron beam induced deposition. Nanoscale 9:16349–16356
Li M, Tang HX, Roukes ML (2007) Ultra-sensitive NEMS-based cantilevers for sensing, scanned probe and very high-frequency applications. Nat Nanotechnol 2(2):114–120
Llobet J, Gerboles M, Sansa M, Bausells J, Borrise X, Perez-Murano F (2015) Fabrication of functional electromechanical nanowire resonators by focused ion beam implantation. J Micro-Nanolithography MEMS and MOEMS 14(3)
Llobet J, Sansa M, Gerbolés M, Mestres N, Arbiol J, Borrisé X, Pérez-Murano F (2014) Enabling electromechanical transduction in silicon nanowire mechanical resonators fabricated by focused ion beam implantation. Nanotechnology 25:135302
López-Polín G, Gómez-Navarro C, Parente V, Katsnelson MI, Pérez-Murano F, Gómez-Herrero J (2015) Increasing the elastic modulus of graphene by controlled defect creation. Nat Phys 11:26
Moczala M, Babij M, Kwoka K, Piasecki T, Sierakowski A, Gotszalk T (2019) Resolution improvement in electromagnetically actuated Wheatstone bridge configuration micromechanical resonators. Sens Actuators A 284:181–185
Moczała M, Kopiec D, Sierakowski A, Dobrowolski R, Grabiec P, Gotszalk T (2014) Investigations of mechanical properties of microfabricated resonators using atomic force microscopy related techniques. Microelectron Eng 119:164–168
Moczała M, Kwoka K, Piasecki T, Kunicki P, Sierakowski A, Gotszalk T (2017) Fabrication and characterization of micromechanical bridges with strain sensors deposited using focused electron beam induced technology. Microelectron Eng 176:111–115
Moczała M, Sierakowski A, Dobrowolski R, Grabiec P, Gotszalk T (2013) Fabrication and measurement of micromechanical bridge structures for mass change detection. Proceedings SPIE, vol 8902, p 89021.s
Nieradka K, Kopiec D, Małozięć G, Kowalska Z, Grabiec P, Janus P, Gotszalk T (2012) Fabrication and characterization of electromagnetically actuated microcantilevers for biochemical sensing, parallel AFM and nanomanipulation. Microelectron Eng 98:676–679
Orłowska K, Słupski P, Świątkowski M, Kunicki P, Sankowska A, Gotszalk T (2015) Light intensity fibre optic sensor for MEMS displacement and vibration metrology. Opt Laser Technol 65:159–163
Orłowska K, Światkowski M, Kunicki P, Kopiec D, Gotszalk T (2016) High-resolution and wide-bandwidth light intensity fiber optic displacement sensor for MEMS metrology. Appl Opt 55(22):5960–5966
Polski Komitet Normalizacyjny (2010) Międzynarodowy słownik metrologii. Pojęcia podstawowe i ogólne oraz terminy z nimi związane (VIM). PKN-ISO/IEC Guide 99
Puydinger M, Velo M, Domingos R, Zhang Y, Maeder X, Guerra-nun C, Be F (2016) Annealing-based electrical tuning of cobalt–carbon deposits grown by focused-electron-beam-induced deposition. ACS Appl Mater Interfaces 8:32496–32503
Rangelow IW, Grabiec P, Gotszalk T, Edinger K (2002) Piezoresistive SXM sensors. Surf Interface Anal 33:59–64
Schwalb Ch, Grimm Ch, Baranowski M, Sachser R, Porrati F, Reith H, Das P, Müller J, Völklein F, Kaya A, Huth M (2010) A tunable strain sensor using nanogranular metals. Sensors 10:9847–9856
Sekaric L, Parpia JM, Craighead H, Feygelson T, Houston B, Butler J (2002) Nanomechanical resonant structures in nanocrystalline diamond. Appl Phys Lett 81:4455–4457
Smith D, Pratt J, Howard L (2009) A fiber-optic sinterferometer with subpicometer resolution for dc and low-frequency displacement measurement. Rev Sci Instrum 80(3):035105
Swiatkowski M, Wojtuś A, Wielgoszewski G, Rudek M, Piasecki T, Jozwiak G, Gotszalk T (2019) A low-noise measurement system for scanning thermal microscopy resistive nanoprobes based on a transformer ratio-arm bridge. Meas Sci Technol 29:045901
Tamayo J (2005) Study of the noise of micromechanical oscillators under quality factor enhancement via driving force control. J Appl Phys 97(4):1–10
Tortonese M, Barrett R, Quate C (1993) Atomic resolution with an atomic force microscope using piezoresistive detection. Appl Phys Lett 62(8):834–836
Zaborowski M, Dumania P, Tomaszewski D, Czupryniak J, Ossowski T (2012) Development of Si nanowire chemical sensors. Proc Eng 47(1000):1053–1056. https://doi.org/10.1016/j.proeng.2012.09.331
Acknowledgements
This work was supported by the Wrocław University of Science and Technology (WUST) statutory grant. The author would like to thank all the coworkers of the Nanometrology Division of the Faculty of Microsystems Electronics and Photonics at the WUST for their support and collaboration.
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Gotszalk, T. (2020). From MEMS to NEMS. In: MEMS: Field Models and Optimal Design. Lecture Notes in Electrical Engineering, vol 573 . Springer, Cham. https://doi.org/10.1007/978-3-030-21496-8_12
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