Abstract
The evolution of CMOS technology and the increased market pressures have set stricter reliability requirements when designing integrated circuits. As one of the dominant unreliability sources, wearout needs to be addressed in a more efficient and effective way. This book has introduced one promising approach which can reverse the effect of wearout through active accelerated recovery techniques. Even if our focus has been mainly on digital CMOS circuits, we believe that similar methods can also be applied to new emerging technologies and can be integrated with the proposed wearout mitigation infrastructure. In this chapter, we preview several such directions that are inspired by self-healing. We believe that instrumenting recovery can be an effective design dimension for securing resilience of future electronic systems.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
References
Geoffrey W Burr, Robert M Shelby, Abu Sebastian, Sangbum Kim, Seyoung Kim, Severin Sidler, Kumar Virwani, Masatoshi Ishii, Pritish Narayanan, Alessandro Fumarola, et al. Neuromorphic computing using non-volatile memory. Advances in Physics: X, 2(1):89–124, 2017.
Bert L Allen and A Rahim Forouhi. Eprom with ultraviolet radiation transparent silicon nitride passivation layer, May 12 1987. US Patent 4,665,426.
S Sarma, N Dutt, N Venkatasubramanian, A Nicolau, and P Gupta. Cyberphysical system-on-chip (cpsoc): Sensor actuator rich self-aware computational platform. University of California Irvine, Tech. Rep. CECS TR-13-06, 2013.
David Brooks and Margaret Martonosi. Dynamic thermal management for high-performance microprocessors. In High-Performance Computer Architecture, 2001. HPCA. The Seventh International Symposium on, pages 171–182. IEEE, 2001.
Author information
Authors and Affiliations
Rights and permissions
Copyright information
© 2020 Springer Nature Switzerland AG
About this chapter
Cite this chapter
Guo, X., Stan, M.R. (2020). Future Directions in Self-healing. In: Circadian Rhythms for Future Resilient Electronic Systems. Springer, Cham. https://doi.org/10.1007/978-3-030-20051-0_7
Download citation
DOI: https://doi.org/10.1007/978-3-030-20051-0_7
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-20050-3
Online ISBN: 978-3-030-20051-0
eBook Packages: EngineeringEngineering (R0)