Skip to main content
SpringerLink
Log in

Electronics Prognostics

  • Chapter
  • First Online:
Fault Diagnosis of Dynamic Systems

  • 910 Accesses

Abstract

This book chapter proposes the use of a model-based prognostics approach for electronics components. Components such as electrolytic capacitors, MOSFETs, and IGBTs are critical components in electronics systems in safety critical domains such as aeronautics, medical, etc. These devices are known to have lower reliability than other electronic components that are used in power supplies of avionics equipment and electrical drivers of electromechanical actuators of control surfaces. The field of prognostics for these is concerned with the prediction of Remaining Useful Life (RUL) of the components and systems. This notion of condition-based health assessment leverages the knowledge of the device physics to model the degradation process, which is then used to estimate remaining useful life as a function of current state of health and future operational and environmental conditions.

This is a preview of subscription content, log in via an institution to check access.

Access this chapter

Log in via an institution
Chapter
USD 29.95
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
eBook
USD 139.00
Price excludes VAT (USA)
  • Available as EPUB and PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book
USD 179.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info
Hardcover Book
USD 179.99
Price excludes VAT (USA)
  • Durable hardcover edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Purchases are for personal use only

Institutional subscriptions

References

  1. Albella, J.M., Gomez-Aleixandre, C., Martinez-Duart, J.M.: Dielectric characteristics of miniature aluminium electrolytic capacitors under stressed voltage conditions. J. Appl. Electrochem. 14(1), 9–14 (1984)

    Article  Google Scholar 

  2. Alwitt, R.S., Parler, S.G.: Heat generation during pulse operation of prototype aluminum electrolytic capacitors. J. Appl. Electrochem. 25(6), 533–542 (1995)

    Article  Google Scholar 

  3. Balaban, E., Saxena, A., Narasimhan, S., Roychoudhury, I., Goebel, K., Koopmans, M.: Airborne electro-mechanical actuator test stand for development of prognostic health management systems. In: Proceedings of the Annual Conference of the Prognostics and Health Management Society, Portland, OR (2010)

    Google Scholar 

  4. Bengt, A.: Electrolytic Capacitors Theory and Applications. RIFA Electrolytic Capacitors (1995)

    Google Scholar 

  5. Bhatti, U., Ochieng, W.: Failure modes and models for integrated GPS/INS systems. J. Navig. 60(2), 327–348 (2007)

    Article  Google Scholar 

  6. Brettle, J., Jackson, N.F.: Failure mechanisms in solid electrolytic capacitors. Electrocompon. Sci. Technol. 3, 233–246 (1977)

    Article  Google Scholar 

  7. Celaya, J., Kulkarni, C., Biswas, G., Goebel, K.: A Model-Based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging (2011)

    Google Scholar 

  8. Celaya, J., Kulkarni, C., Biswas, G., Goebel, K.: Towards Prognostics of Electrolytic Capacitors. In: AIAA 2011 Infotech@Aerospace Conference. AIAA, St. Louis, MO (2011)

    Google Scholar 

  9. Celaya, J., Kulkarni, C., Biswas, G., Goebel, K.: Towards a model-based prognostics methodology for electrolytic capacitors: A case study based on electrical overstress accelerated aging. Int. J. Progn. Health Manag. 3(004) (2012)

    Google Scholar 

  10. Celaya, J., Saxena, A., Wysocki, P., Saha, S., Goebel, K.: Towards prognostics of power mosfets: accelerated aging and precursors of failure. In: Proceedings of the Annual Conference of the Prognostics and Health Management Society, Portland, OR (2010)

    Google Scholar 

  11. Chatfield, C.: The Analysis of Time Series: An Introduction, 6th edn. Chapman and Hall/CRC, Boca Raton (2003)

    Google Scholar 

  12. Daigle, M., Goebel, K.: A model-based prognostics approach applied to pneumatic valves. Int. J. Progn. Health Manag. Soc. 2(8), 1–16 (2011)

    Google Scholar 

  13. Gomez-Aleixandre, C., Albella, J.M., Martinez-Duart, J.M.: Gas evolution in aluminum electrolytic capacitors. J. Electrochem. Soc. 131(3), 612–614 (1984)

    Article  Google Scholar 

  14. Hansen, P., McCluskey, P.: Failure models in power device interconnects. In: European Conference on Power Electronics and Applications, pp. 1–9, Aalborg, Denmark (2007)

    Google Scholar 

  15. IEC: 60384-4-1 fixed capacitors for use in electronic equipment. Technical Report (2007-03)

    Google Scholar 

  16. Ikonopisov, S.: Theory of electrical breakdown during formation of barrier anodic films. Electrochim. Acta 22(10), 1077–1082 (1977)

    Article  Google Scholar 

  17. Kulkarni, C., Biswas, G., Bharadwaj, R., Kim, K.: Effects of Degradation in DC-DC Converters on Avionics Systems: A Model Based Approach, pp. 8–13 (2010)

    Google Scholar 

  18. Kulkarni, C., Biswas, G., Celaya, J., Goebel, K.: Prognostic Techniques for Capacitor Degradation and Health Monitoring. In: The Maintenance and Reliability Conference (MARCON), Knoxville, TN (2011)

    Google Scholar 

  19. Kulkarni, C., Biswas, G., Koutsoukos, X.: A prognosis case study for electrolytic capacitor degradation in DC-DC converters. In: Proceedings of the Annual Conference of the Prognostics and Health Management Society, San Diego, CA (2009)

    Google Scholar 

  20. Kulkarni, C., Biswas, G., Koutsoukos, X., Goebel, K., Celaya, J.: Experimental studies of ageing in electrolytic capacitors. In: Proceedings of the Annual Conference of the Prognostics and Health Management Society, Portland, OR (2010)

    Google Scholar 

  21. Kulkarni, C., Biswas, G., Koutsoukos, X., Goebel, K., Celaya, J.: Integrated diagnostic/prognostic experimental setup for capacitor degradation and health monitoring. In: IEEE AUTOTESTCON, Orlando, FL (2010)

    Google Scholar 

  22. Kulkarni, C., Biswas, G., Koutsoukos, X., Goebel, K., Celaya, J.: Physics of failure models for capacitor degradation in dc-dc converters. In: The Maintenance and Reliability Conference (MARCON), Knoxville, TN (2010)

    Google Scholar 

  23. Kulkarni, C., Celaya, J., Biswas, G., Goebel, K.: Prognostic modeling and experimental techniques for electrolytic capacitor health monitoring. In: The 8th International Workshop on Structural Health Monitoring (IWSHM). Stanford University, Stanford, CA (2011)

    Google Scholar 

  24. Kulkarni, C., Celaya, J., Biswas, G., Goebel, K.: Physics based degradation models for capacitor prognostics under thermal overstress conditions. Int. J. Progn. Health Manag. 4(005) (2013)

    Google Scholar 

  25. Luo, J., Namburu, M., Pattipati, K., Qiao, L., Kawamoto, M., Chigusa, S.: Model-based prognostic techniques [maintenance applications]. In: Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference, pp. 330–340, Anaheim, CA (2003). https://doi.org/10.1109/AUTEST.2003.1243596

  26. MIL-C-62F: General specification for capacitors. Fixed Electrolytic (2008)

    Google Scholar 

  27. Nasser, L., Curtin, M.: Electronics reliability prognosis through material modeling and simulation. In: Proceedings of IEEE Aerospace Conference, Big Sky, MT, USA (2006)

    Google Scholar 

  28. Rodner, S.C., Wedin, P., Bergstram, L.: Effect of electrolyte and evaporation rate on the structural features of dried silica monolayer films. Langmuir 18(24), 9327–9333 (2002). https://doi.org/10.1021/la020259q

    Article  Google Scholar 

  29. Roederstein, V.: Aluminum capacitors - general information. Document - 25001 (2007)

    Google Scholar 

  30. Rusdi, M., Moroi, Y., Nakahara, H., Shibata, O.: Evaporation from water ethylene glycol liquid mixture. Langmuir Am. Chem. Soc. 21(16), 7308–7310 (2005)

    Google Scholar 

  31. Saha, B., Goebel, K.: Model adaptation for prognostics in a particle filtering framework. Int. J. Progn. Health Manag. Soc. 2(6), 1–12 (2011)

    Google Scholar 

  32. Saha, B., Goebel, K., Christophersen, J.: Comparison of prognostic algorithms for estimating remaining useful life of batteries. Trans. Inst. Meas. Control 31(3–4), 293–308 (2009)

    Article  Google Scholar 

  33. Stengel, R.F.: Optimal Control and Estimation. Dover Books on Advanced Mathematics (1994)

    Google Scholar 

  34. Tasca, D., O’Donnell, H., Stokes, S.: Pulse Power Response and Damage Characterization of Capacitors. In: Proceedings of the EOS/ESD Symposium, pp. 174–191. ESD Assn, Las Vegas, Rome, NY (1981)

    Google Scholar 

  35. Upadhyayula, K., Dasgupta, A.: Guidelines for Physics-of-Failure Based Accelerated Stress Testing. In: Annual Reliability and Maintainability Symposium, pp. 345–357, Anaheim, CA (1998)

    Google Scholar 

  36. Vichare, N., Pecht, M.: Prognostics and health management of electronics. IEEE Trans. Compon. Packag. Technol. 29(1), 222–229 (2006)

    Article  Google Scholar 

  37. Watson, G.F.: Mil reliabiliy: a new approach. IEEE Spectr. 29(8), 46–49 (1992)

    Article  Google Scholar 

  38. Wit, H.D., Crevecoeur, C.: The dielectric breakdown of anodic aluminum oxide. Phys. Lett. A 50(5), 365–366 (1974)

    Article  Google Scholar 

Download references

Author information

Authors and Affiliations

  1. SGT, Inc., NASA Ames Research Center, Moffett Field, Mountain View, CA, 94035, USA

    Chetan S. Kulkarni

  2. Schlumberger, Software Technology Innovation Center, Menlo Park, CA, 94025, USA

    Jose Celaya

Authors
  1. Chetan S. Kulkarni
    View author publications

    You can also search for this author in PubMed Google Scholar

  2. Jose Celaya
    View author publications

    You can also search for this author in PubMed Google Scholar

Corresponding author

Correspondence to Chetan S. Kulkarni .

Editor information

Editors and Affiliations

  1. Research Center for Supervision, Safety and Automatic Control (CS2AC), Universitat Politècnica de Catalunya (UPC), Terrassa, Spain

    Teresa Escobet

  2. Department of Computer Science, University of Valladolid, Segovia, Spain

    Anibal Bregon

  3. Department of Computer Science, University of Valladolid, Valladolid, Spain

    Belarmino Pulido

  4. Research Center for Supervision, Safety and Automatic Control (CS2AC), Universitat Politècnica de Catalunya (UPC), Terrassa, Spain

    Vicenç Puig

Rights and permissions

Reprints and permissions

Copyright information

© 2019 Springer Nature Switzerland AG

About this chapter

Check for updates. Verify currency and authenticity via CrossMark

Cite this chapter

Kulkarni, C.S., Celaya, J. (2019). Electronics Prognostics. In: Escobet, T., Bregon, A., Pulido, B., Puig, V. (eds) Fault Diagnosis of Dynamic Systems. Springer, Cham. https://doi.org/10.1007/978-3-030-17728-7_18

Download citation

Publish with us

Policies and ethics

Search

Navigation