Abstract
In static atomic force microscopy the force between the tip and the sample leads to a deflection of the cantilever according to Hooke’s law. This cantilever bending is measured, for instance, by the beam deflection method. The name static comes from the fact that the cantilever is not excited to oscillate, as in the dynamic modes of AFM. In the following, we will discuss the static mode, while the dynamic variants are considered in the subsequent chapters. At the end of this chapter, we discuss how force-distance curves can be used to identify the tip-sample interaction regime in which subsequent imaging is performed.
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Notes
- 1.
This is somewhat different from the tip-sample distance used for the Lennard-Jones force, where a tip-sample distance (or better atom-atom distance) of zero corresponds to a repulsive force approaching infinite strength.
References
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Voigtländer, B. (2019). Static Atomic Force Microscopy. In: Atomic Force Microscopy. NanoScience and Technology. Springer, Cham. https://doi.org/10.1007/978-3-030-13654-3_12
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DOI: https://doi.org/10.1007/978-3-030-13654-3_12
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