Abstract
Since polycrystalline materials consist of a complex network of various types of grain boundaries (GBs), a detailed study on the types of the GBs , their distribution and how they are connected is crucial to further enhance the material’s performance. Herein, the GB character distribution (types and connectivity) of as-deposited Al and Al-alloy 7075 thin films , as well as annealed Al-alloy thin films , was investigated using an advanced microscopic technique: ACOM-TEM . Annealing processes up to 12 h caused a decrease in the content ratio of random high-angle GBs (r-HAGBs) and triple junctions comprised of r-HAGBs. However, there was no significant consequence of alloying in the GB type and connectivity distribution. Furthermore, our results indicate that vacuum-deposited Al or Al-alloy thin films possess a strong <111> texture, and a characteristic GB distribution consisting of a significantly high fraction of low coincidence site lattice GBs (predominant ∑1 followed by ∑13b, ∑7, ∑21a, ∑31a and ∑19b in descending order) and a minor fraction of r-HAGBs.
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Acknowledgements
The authors are thankful to the Welch Foundation Grant (No. AX-1615) and Department of Defense Grant (No. 64756-RT-REP and 72489-RT-REP). RMC acknowledges the National Council for Science and Technology (Conacyt), Mexico, for the support provided through the Postdoctoral Scholarship Program.
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Parajuli, P., Mendoza-Cruz, R., Yacamán, M.J., Ponce, A. (2019). Alloying and Annealing Effects on Grain Boundary Character Evolution of Al-alloy 7075 Thin Films: An ACOM-TEM Analysis. In: Li, B., et al. Characterization of Minerals, Metals, and Materials 2019. The Minerals, Metals & Materials Series. Springer, Cham. https://doi.org/10.1007/978-3-030-05749-7_12
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