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Distributed Fault-Tolerant Backup-Placement in Overloaded Wireless Sensor Networks

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Broadband Communications, Networks, and Systems (BROADNETS 2018)

Abstract

Wireless Sensor Networks (WSNs) frequently have distinguished amount of data loss, causing data integrity issues. Sensor nodes are inherently a cheap piece of hardware - due to the common need to use many of them over a large area - and usually contain a small amount of RAM and flash memory, which are insufficient in case of high degree of data sampling. An overloaded sensor can harm the data integrity, or even completely reject incoming messages. The problem gets even worse when data should be received from many nodes, as missing data becomes a more common phenomenon as deployed WSNs grow in scale. In cases of an overflow, our Distributed Adaptive Clustering algorithm (D-ACR) reconfigures the network, by adaptively and hierarchically re-clustering parts of it, based on the rate of incoming data packages in order to minimize the energy-consumption, and prevent premature death of nodes. However, the re-clustering cannot prevent data loss caused by the nature of the sensors. We suggest to address this problem by an efficient distributed backup-placement algorithm named DBP-ACR, performed on the D-ACR refined clusters. The DBP-ACR algorithm re-directs packages from overloaded sensors to more efficient placements outside of the overloaded areas in the WSN cluster, thus increasing the fault-tolerance of the network and reducing the data loss.

This work was supported by the Lynn and William Frankel Center for Computer Science, the Open University of Israel’s Research Fund, and ISF grant 724/15.

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Correspondence to Gal Oren .

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Oren, G., Barenboim, L., Levin, H. (2019). Distributed Fault-Tolerant Backup-Placement in Overloaded Wireless Sensor Networks. In: Sucasas, V., Mantas, G., Althunibat, S. (eds) Broadband Communications, Networks, and Systems. BROADNETS 2018. Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, vol 263. Springer, Cham. https://doi.org/10.1007/978-3-030-05195-2_21

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  • DOI: https://doi.org/10.1007/978-3-030-05195-2_21

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-05194-5

  • Online ISBN: 978-3-030-05195-2

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