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Single-Event Effects Test Methods

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Radiation Effects on Integrated Circuits and Systems for Space Applications

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Abstract

This chapter presents an overview of main types of single-event effects (SEE), basic characteristics of sensitivity of devices and integrated circuits to SEE and existing standards and guidelines for testing with the use of heavy ion and proton accelerators. Basic requirements for both heavy ion and proton testing will be considered in detail including requirements for the energy of ions, their linear energy transfer (LET) and the range in semiconductor, recommendations for choosing the flux and fluence of ions, requirements for beam control during testing. Also this chapter gives information about the specifics of testing for different types of SEE, such as: impact of temperature and electrical bias conditions on the test results; recommendations for choosing test patterns during testing; advantages and disadvantages of static and dynamic testing; impact of total ionizing dose effects on test results; specifics of testing for destructive types of SEEs and others. Recommendations for choosing the SEE test algorithms are summarized.

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Author information

Authors and Affiliations

  1. Research Institute of Scientific Instruments (RISI), Moscow, Russian Federation

    Konstantin Tapero

  2. National University of Science and Technology MISIS, Moscow, Russian Federation

    Konstantin Tapero

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  1. Konstantin Tapero
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Editor information

Editors and Affiliations

  1. Centre Nationale Recherche Scientifique (CNRS), Grenoble, France

    Raoul Velazco

  2. United States Naval Research Laboratory, Washington, DC, USA

    Dale McMorrow

  3. Spectrum Aerospace Group, Munich, Germany

    Jaime Estela

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Tapero, K. (2019). Single-Event Effects Test Methods. In: Velazco, R., McMorrow, D., Estela, J. (eds) Radiation Effects on Integrated Circuits and Systems for Space Applications. Springer, Cham. https://doi.org/10.1007/978-3-030-04660-6_3

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  • DOI: https://doi.org/10.1007/978-3-030-04660-6_3

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-04659-0

  • Online ISBN: 978-3-030-04660-6

  • eBook Packages: EngineeringEngineering (R0)

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