Abstract
For critical software applications, dependability and safety are required features that should respect security principles. To cope with these constraints, the design activity should use methods that foster knowledge sharing and reuse, in particular security problems and their solutions. In this paper, we present a new problem-oriented method that follows a step-wise building of the solution. Problems are reused using various mechanisms, and a solution is conceived, verified and diagnosed. We wish to illustrate the approach, building a secure SCADA architecture.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Notes
- 1.
Each kind of combination is represented with a particular arrow shape.
References
Ball, T., Naik, M., Rajamani, S.K.: From symptom to cause: localizing errors in counterexample traces. In: ACM SIGPLAN Notices, vol. 38. ACM (2003)
Basili, V.R., Caldiera, G.: Improve software quality by reusing knowledge and experience. MIT Sloan Manage. Rev. 37(1), 55 (1995)
Clarke, E.M., Kurshan, R.P., Veith, H.: The localization reduction and counterexample-guided abstraction refinement. In: Manna, Z., Peled, D.A. (eds.) Time for Verification. LNCS, vol. 6200, pp. 61–71. Springer, Heidelberg (2010). https://doi.org/10.1007/978-3-642-13754-9_4
Cleve, H., Zeller, A.: Locating causes of program failures, p. 342. ACM Press (2005)
Fernandez, E.B., Larrondo-Petrie, M.M.: Designing secure SCADA systems using security patterns, pp. 1–8. IEEE (2010)
Gamma, E. (ed.): Design Patterns: Elements of Reusable Object-oriented Software. Addison-Wesley Professional Computing Series. Addison-Wesley, Reading (1995)
Groce, A., Visser, W.: What went wrong: explaining counterexamples. In: Ball, T., Rajamani, S.K. (eds.) SPIN 2003. LNCS, vol. 2648, pp. 121–136. Springer, Heidelberg (2003). https://doi.org/10.1007/3-540-44829-2_8
Hall, J., Jackson, M., Laney, R., Nuseibeh, B., Rapanotti, L.: Relating software requirements and architectures using problem frames. IEEE Computer Society (2002)
Leilde, V., Ribaud, V., Dhaussy, P.: An organizing system to perform and enable verification and diagnosis activities. In: Yin, H., et al. (eds.) IDEAL 2016. LNCS, vol. 9937, pp. 576–587. Springer, Cham (2016). https://doi.org/10.1007/978-3-319-46257-8_62
Leildé, V., Ribaud, V., Teodorov, C., Dhaussy, P.: A diagnosis framework for critical systems verification (short paper). In: Cimatti, A., Sirjani, M. (eds.) SEFM 2017. LNCS, vol. 10469, pp. 394–400. Springer, Cham (2017). https://doi.org/10.1007/978-3-319-66197-1_27
Leilde, V., Ribaud, V., Teodorov, C., Dhaussy, P.: Domain-oriented verification management. In: 8th International Conference on Model and Data Engineering (MEDI 2018), October 2018
Obeid, F.: Validation Formelle d Implantation de Patrons de Securite. Ph.D. thesis, ENSTA-Bretagne (2018)
Obeid, F., Dhaussy, P.: Validation formelle d’implementation des patrons de sécurité: application aux scada. In: Hurault, A., Stouls, N. (eds.) Actes des 15èmes journées sur les Approches Formelles dans l’Assistance au Développement de Logiciels, Besançon, France, pp. 13–18, June 2016
Schumacher, M., Fernandez-Buglioni, E., Hybertson, D., Buschmann, F., Sommerlad, P.: Security Patterns: Integrating Security and Systems Engineering. Wiley, Hoboken (2013)
Steel, C., Nagappan, R., Lai, R.: Core Security Patterns: Best Practices and Strategies for J2EE, Web Services, and Identity Management. Pearson Education, London (2012)
Author information
Authors and Affiliations
Corresponding author
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 2018 Springer Nature Switzerland AG
About this paper
Cite this paper
Leildé, V., Ribaud, V., Teodorov, C., Dhaussy, P. (2018). A Problem-Oriented Approach to Critical System Design and Diagnosis Support. In: Abdelwahed, E., et al. New Trends in Model and Data Engineering. MEDI 2018. Communications in Computer and Information Science, vol 929. Springer, Cham. https://doi.org/10.1007/978-3-030-02852-7_3
Download citation
DOI: https://doi.org/10.1007/978-3-030-02852-7_3
Published:
Publisher Name: Springer, Cham
Print ISBN: 978-3-030-02851-0
Online ISBN: 978-3-030-02852-7
eBook Packages: Computer ScienceComputer Science (R0)