Abstract
In the present paper, mechanical properties of multilayer coatings were investigated. To that end, an analytical model dedicated for characterizing the thin multilayer behaviors was considered. In this study, the nanoindentation tests on film/substrate material systems were systematically investigated using finite element modeling (FEM). Hence, the considered model of Mercier et al. is efficient for measuring meaningful mechanical properties of thin film materials up to a critical ratio Ef/Es = 1.18 (with Ef the Young’s modulus of the film and Es the Young’s modulus of the substrate). But, for Ef/Es ≥ 1.18 a divergence of the model was observed. The main error is caused by a wrong estimation of the contact surface Ac between the indenter tip and the film surface. As a matter of fact, for a soft film on a hard substrate (Ef/Es < 1.18) the deformation is almost localized at the film. However, for Ef/Es ≥ 1.18 the deformation spreads at the substrate which induces a wrong value of contact surface Ac.
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References
Amaya-Roncancio, S., Restrepo-Parra, E., Devia-Narvaez, D.M., Arias-Mateus, D.F., Gómez-Hermida, M.M.: Molecular dynamics simulation of nanoindentation in Cr, Al layers and Al/ Cr bilayers, using a hard spherical nanoindenter. DYNA. 81, 102–107 (2014)
Azadi, M., Rouhaghdam, A.S., Ahangarani, S., Mofidi, H.H.: Mechanical behavior of TiN/TiC multilayer coatings fabricated by plasma assisted chemical vapor deposition on AISI H13 hot work tool steel. Surf. Coat. Technol. 245, 156–166 (2014)
Chakroun, N., Tekaya, A., Belhadjsalah, H., Benameur, T.: Measuring elastic properties of the constituent multilayer coatings for different modulation periods. Int. J. Appl. Mech. 10 (2018)
Inui, N., Mochiji, K., Moritani, K.: A nondestructive method for probing mechanical properties of a thin film using impacts with nanoclusters. Int. J. Appl. Mech. 8, 1650041 (2016)
Kumar, A., Zeng, K.: Alternative methods to extract the hardness and elastic modulus of thin films from nanoindentation load-displacement data. Int. J. Appl. Mech. 2, 41–68 (2010)
Doerner, M.F., Nix, W.D.: A method for interpreting the data from depth-sensing indentation instruments (1986)
Oliver, W.C., Pharr, G.M.: An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments. J. Mater. Res. 7, 1564–1583 (1992)
Jung, Y.G., Lawn, B.R., Martyniuk, M., Huang, H., Hu, X.Z.: Evaluation of elastic modulus and hardness of thin films by nanoindentation. J. Mater. Res. 19, 3076–3080 (2004)
Bull, S.J.: A simple method for the assessment of the contact modulus for coated systems. Philos. Mag. 95, 1907–1927 (2015)
Mercier, D., Mandrillon, V., Verdier, M., Brechet, Y.: Mesure de module d’Young d’un film mince à partir de mesures expérimentales de nanoindentation réalisées sur des systèmes multicouches. Matériaux Tech. 99, 169–178 (2011)
Chakroun, N., Tekaya, A., Belhadjsalah, H., Benameur, T.: A new inverse analysis method for identifying the elastic properties of thin films considering thickness and substrate effects simultaneously. Int. J. Appl. Mech. 9, 1750096 (2017)
Liao, Y., Zhou, Y., Huang, Y., Jiang, L.: Measuring elastic-plastic properties of thin films on elastic-plastic substrates by sharp indentation. Mech. Mater. 41, 308–318 (2009)
Bec, S., Tonck, A., Georges, J.-M., Georges, E., Loubet, J.-L.: Improvements in the indentation method with a surface force apparatus. Philos. Mag. A 74, 1061–1072 (1996). https://doi.org/10.1080/01418619608239707
ABAQUS Version 6.14, Dessault systèmes simulia corp., Providence, RI, USA (2014)
Jayaraman, S., Hahn, G.T., Oliver, W.C., Rubin, C.A., Bastias, P.C.: Determination of monotonic stress-strain curve of hard materials from ultra-low-load indentation tests. Int. J. Solids Struct. 35, 365–381 (1998)
Cheng, Y.T., Cheng, C.M.: Scaling, dimensional analysis, and indentation measurements. Mater. Sci. Eng. R Rep. 44, 91–150 (2004)
Pelletier, H., Krier, J., Mille, P.: Characterization of mechanical properties of thin films using nanoindentation test. Mech. Mater. 38, 1182–1198 (2006)
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Chakroun, N., Belhadjsalah, H. (2019). Mechanical Characterization of Film/Substrate Materials Using Nanoindentation Technique. In: Silva, L. (eds) Materials Design and Applications II. Advanced Structured Materials, vol 98. Springer, Cham. https://doi.org/10.1007/978-3-030-02257-0_31
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