Abstract
The purpose of this chapter is to report on a comparison of the IL data obtained under light and heavy ion irradiations as a means to reveal the different physical processes operating in each case. In all cases, recombination of self-trapped excitons (STEs) at color centers, Non-Bridging Oxygen Hole Centers (NBOHCs) and Oxygen-Deficient Centers (in particular, ODCII), created by irradiation, are assumed to be the predominant light emission process for the red (1.9 eV) and blue (2.7 eV) emissions, respectively. However, the comparison of the IL kinetics under light and heavy ion irradiations shows remarkable differential features. In particular, it reveals a coupling between the irradiation-induced structural damage caused by swift-heavy ion (SHI) irradiation and light emission. This coupling is absent for light ions due to their much lower structural disorder on the SiO\(_{2}\) network.
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References
K. Awazu, S. Ishii, K. Shima, S. Roorda, J.L. Brebner, Structure of latent tracks created by swift heavy-ion bombardment of amorphous SiO\(_{2}\). Phys. Rev. B Condens. Matter Mater. Phys. 62, 3689–3698 (2000)
R. Saavedra, M. León, P. Martín, D. Jiménez-Rey, R. Vila, S. Girard, A. Boukenter, Y. Querdane, Raman measurements in silica glasses irradiated with energetic ions. AIP Conf. Proc. 1624, 118–124 (2014)
E. Vella, R. Boscaino, Structural disorder and silanol groups content in amorphous SiO\(_{2}\). Phys. Rev. B Condens. Matter Mater. Phys. 79(8), 085204 (2009)
J.F. Ziegler, J.P. Biersack, U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1985), http://www.srim.org
J.F. Ziegler, SRIM: The Stopping and Range of Ions in Matter, http://www.srim.org/
R.C. Ropp, Luminescence and the Solid State (Elsevier, Amsterdam, 2004)
K. Kajihara, L. Skuja, M. Hirano, H. Hosono, Formation and decay of nonbridging oxygen hole centers in SiO\(_{2}\) glasses induced by F\(_{2}\) laser irradiation: in situ observation using a pump and probe technique. Appl. Phys. Lett. 79(12), 1757–1759 (2001)
K. Kajihara, Y. Ikuta, M. Hirano, T. Ichimura, H. Hosono, Interaction of F\(_{2}\) excimer laser pulses with hydroxy groups in SiO\(_{2}\) glass: hydrogen bond formation and bleaching of vacuum ultraviolet absorption edge. J. Chem. Phys. 115(20), 9473–9476 (2001)
H. Hosono, K. Kajihara, T. Suzuki, Y. Ikuta, L. Skuja, M. Hirano, Vacuum ultraviolet optical absorption band of non-bridging oxygen hole centers in SiO\(_{2}\) glass. Solid State Commun. 122(3–4), 117–120 (2002)
T.E. Tsai, D.L. Griscom, Experimental evidence for excitonic mechanism of defect generation in high-purity silica. Phys. Rev. Lett. 67, 2517–2520 (1991)
H. Hosono, Y. Ikuta, T. Kinoshita, K. Kajihara, M. Hirano, Physical disorder and optical properties in the vacuum ultraviolet region of amorphous SiO\(_{2}\). Phys. Rev. Lett. 87, 175501 (2001)
F. Messina, L. Vaccaro, M. Cannas, Generation and excitation of point defects in silica by synchrotron radiation above the absorption edge. Phys. Rev. B Condens. Matter Mater. Phys. 81, 035212 (2010)
A.K.S. Song, R.T. Williams, Self-Trapped Excitons (Springer, Berlin, 1996)
N. Itoh, A.M. Stoneham, Materials Modification by Electronic Excitation (Cambridge University Press, Cambridge, 2001)
J.M. Costantini, F. Brisard, G. Biotteau, E. Balanzat, B. Gervais, Self-trapped exciton luminescence induced in alpha quartz by swift heavy ion irradiations. J. Appl. Phys. 88, 1339–1345 (2000)
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Bachiller Perea, D. (2018). Ionoluminescence in Silica: Role of the Silanol Group Content and the Ion Stopping Power. In: Ion-Irradiation-Induced Damage in Nuclear Materials. Springer Theses. Springer, Cham. https://doi.org/10.1007/978-3-030-00407-1_7
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