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Springer Handbook of Microscopy pp 1279–1329Cite as

Electron Tomography in Materials Science

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Abstract

This chapter illustrates how electron tomography has become a technique of primary importance in the three-dimensional () microscopic analysis of materials. The foundations of tomography are set out with descriptions of the Radon transform and its inverse and its relationship to the Fourier transform and the Fourier slice theorem. The acquisition of a tilt series of images is described and how the angular sampling in the series affects the overall 3-D resolution in the tomogram. The imaging modes available in the (scanning) transmission electron microscope are explored with reference to their application in electron tomography and how each mode can provide complementary information on the structural, chemical, electronic, and magnetic properties of the material studied. The chapter also sets out in detail methods for tomographic reconstruction from backprojection and iterative methods, such as simultaneous iterative reconstruction technique ( ) and algebraic reconstruction technique ( ), through to more recent compressed sensing approaches that aim to build in prior knowledge about the specimen into the reconstruction process. The chapter concludes with a look to the future.

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Acknowledgements

The research leading to these results was possible through funding from the European Union Seventh Framework Program under Grant Agreement 312483-ESTEEM2 (Integrated Infrastructure Initiative–I3), from the European Research Council under the European Union's Seventh Framework Program (FP/2007–2013)/ERC Grant Agreement 291522–3-DIMAGE, and funding from the EPSRC, grant number EP/R008779/1. R.K.L. acknowledges a Junior Research Fellowship at Clare College. The authors acknowledge the many people with whom they have worked, including most recently Sir John Meurig Thomas, Francisco de la Pena, Sean Collins, Adam Lee, Emilie Ringe, Alex Eggeman, Jon Barnard, Duncan Johnstone, and David Rossouw.

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  1. Dept. of Materials Science & Metallurgy, University of Cambridge, Cambridge, UK

    Rowan K. Leary & Paul A. Midgley

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  1. Rowan K. Leary
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Correspondence to Paul A. Midgley .

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  1. CEMES-CNRS, Toulouse, France

    Peter W. Hawkes

  2. Dept. of Physics, Arizona State University, Tempe, AZ, USA

    John C. H. Spence

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Leary, R.K., Midgley, P.A. (2019). Electron Tomography in Materials Science. In: Hawkes, P.W., Spence, J.C.H. (eds) Springer Handbook of Microscopy. Springer Handbooks. Springer, Cham. https://doi.org/10.1007/978-3-030-00069-1_26

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