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Photoemission Electron Microscopy

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Springer Handbook of Microscopy

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Abstract

Photoemission electron microscopy (PEEM) is a cathode lens electron microscopy technique. This specialized electron microscopy technique excels in studying the morphology, electronic and chemical properties and the magnetic structure of surfaces and thin film materials with nanometer-scale spatial resolution. In this chapter, we describe X-PEEM instrumentation and a typical X-PEEM optical system, discuss aberrations that limit the optical performance of X-PEEM microscopes, describe contrast mechanisms, and present several examples that cover some of the common use cases for X-PEEM, in particular the magnetic and time-resolved microscopy of nanostructures.

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Acknowledgements

We would like to thank our collaborators E. Folven, Y. Takamura, J. Grepstad, A. Farhan, B. Leung, A.P. Hitchcock, and P.U.P.A. Gilbert, whose ALS work is discussed in this chapter. The chapter was copyedited by C.E. Scholl. This research used resources of the Advanced Light Source, which is a DOE Office of Science User Facility under contract no. DE-AC02-05CH11231.

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    Jun Feng & Andreas Scholl

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Correspondence to Jun Feng .

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  2. Dept. of Physics, Arizona State University, Tempe, AZ, USA

    John C. H. Spence

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Feng, J., Scholl, A. (2019). Photoemission Electron Microscopy. In: Hawkes, P.W., Spence, J.C.H. (eds) Springer Handbook of Microscopy. Springer Handbooks. Springer, Cham. https://doi.org/10.1007/978-3-030-00069-1_10

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