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The New Progress in the Research of Binary Vulnerability Exploits

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Cloud Computing and Security (ICCCS 2018)

Part of the book series: Lecture Notes in Computer Science ((LNISA,volume 11064))

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Abstract

The vulnerabilities exploitable validation is the core of vulnerability analysis technology. To solve the limitations of manual reappearance and exploits of vulnerabilities, current vulnerability automatic exploit technology has achieved preliminary progress. This paper presented an overview of the field of automatic vulnerability exploits, and classified current automatic vulnerability exploits method into 3 categories: patch comparison scheme, control flow oriented scheme and data flow oriented scheme, introduced the core principle, process, research status of each category, summarized the advantages and limitations of each category, and proposed the direction of future research. This survey on software vulnerability automatic exploits can provide a theoretical guidance for the future research work.

Supported by National University of Defense and Technology and National Natural Science Foundation No.61402492.

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Authors and Affiliations

  1. National University of Defense and Technology, Changsha, 410073, China

    Tiantian Tan, Baosheng Wang, Zhou Xu & Yong Tang

Authors
  1. Tiantian Tan
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  2. Baosheng Wang
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  3. Zhou Xu
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  4. Yong Tang
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Corresponding author

Correspondence to Baosheng Wang .

Editor information

Editors and Affiliations

  1. Nanjing University of Information Science and Technology, Nanjing, China

    Xingming Sun

  2. Nanjing University of Information Science and Technology, Nanjing, China

    Zhaoqing Pan

  3. Department of Computer Science, Purdue University, West Lafayette, IN, USA

    Elisa Bertino

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Tan, T., Wang, B., Xu, Z., Tang, Y. (2018). The New Progress in the Research of Binary Vulnerability Exploits. In: Sun, X., Pan, Z., Bertino, E. (eds) Cloud Computing and Security. ICCCS 2018. Lecture Notes in Computer Science(), vol 11064. Springer, Cham. https://doi.org/10.1007/978-3-030-00009-7_26

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  • DOI: https://doi.org/10.1007/978-3-030-00009-7_26

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  • Publisher Name: Springer, Cham

  • Print ISBN: 978-3-030-00008-0

  • Online ISBN: 978-3-030-00009-7

  • eBook Packages: Computer ScienceComputer Science (R0)

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