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Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles

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Scanning Electron Microscopy and X-Ray Microanalysis

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Abstract

There are two “zero-th level” assumptions that underpin the basis for quantitative electron-excited X-ray microanalysis:

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Authors and Affiliations

  1. University of Massachusetts, Amherst, Massachusetts, USA

    Joseph I. Goldstein

  2. National Institute of Standards and Technology, Gaithersburg, Maryland, USA

    Dale E. Newbury, Nicholas W. M. Ritchie & John Henry J. Scott

  3. Sandia National Laboratories, Albuquerque, New Mexico, USA

    Joseph R. Michael

  4. University of Tennessee, Knoxville, Tennessee, USA

    David C. Joy

Authors
  1. Joseph I. Goldstein
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  2. Dale E. Newbury
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  3. Joseph R. Michael
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  4. Nicholas W. M. Ritchie
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  5. John Henry J. Scott
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  6. David C. Joy
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Goldstein, J.I., Newbury, D.E., Michael, J.R., Ritchie, N.W.M., Scott, J.H.J., Joy, D.C. (2018). Analysis of Specimens with Special Geometry: Irregular Bulk Objects and Particles. In: Scanning Electron Microscopy and X-Ray Microanalysis. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-6676-9_23

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