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The Geometry of Electron Diffraction Patterns

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Advanced Transmission Electron Microscopy

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Abstract

An object illuminated by an incident wave field produces a characteristic diffraction pattern, measured as a function of scattering angle, at a large distance from the object.

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Authors and Affiliations

  1. Frederick-Seitz Materials Research Laboratory, Department of Materials Science and Engineering, University of Illinois, Urbana-Champaign, Urbana, Illinois, USA

    Jian Min Zuo

  2. Department of Physics, Arizona State University, Tempe, Arizona, USA

    John C. H. Spence

Authors
  1. Jian Min Zuo
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  2. John C. H. Spence
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Corresponding authors

Correspondence to Jian Min Zuo or John C. H. Spence .

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Zuo, J.M., Spence, J.C.H. (2017). The Geometry of Electron Diffraction Patterns. In: Advanced Transmission Electron Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-6607-3_3

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