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Advanced Transmission Electron Microscopy pp 501–552Cite as

Imaging and Characterization of Crystal Defects

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Abstract

This chapter describes the theory of imaging and characterization of defects in crystals by electron microscopy. We start with an overview. This is followed by an introduction to atomic displacements and strain in crystals. The following sections then discuss the kinematic theory of diffraction contrast imaging, the weak-beam imaging technique, and the dynamical theory of electron diffraction from crystal defects. This is followed by a review of diffraction-based defect characterization methods, using CBIM or LACBED. The last section describes the determination of atomic structure of defects using HREM and STEM.

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Authors and Affiliations

  1. Frederick-Seitz Materials Research Laboratory, Department of Materials Science and Engineering, University of Illinois, Urbana-Champaign, Urbana, Illinois, USA

    Jian Min Zuo

  2. Department of Physics, Arizona State University, Tempe, Arizona, USA

    John C. H. Spence

Authors
  1. Jian Min Zuo
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  2. John C. H. Spence
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Correspondence to Jian Min Zuo or John C. H. Spence .

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Zuo, J.M., Spence, J.C.H. (2017). Imaging and Characterization of Crystal Defects. In: Advanced Transmission Electron Microscopy. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-6607-3_15

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