Abstract
Electrical tests are conducted during manufacturing for verification of all functions of individual CMOS chips and systems. In logic testing, test vectors are applied to inputs, and output responses are compared with expected results. Memory tests are conducted by writing and reading each individual cell in all arrays. Design for testability (DFT) features incorporated in chip design help improve test efficiency and facilitate debug. Scribe-line tests of circuit components during silicon manufacturing, on-chip process, voltage and temperature monitors, and characterization and modeling of the aggregate behavior of the chip provide physical insight and assist rapid failure diagnostics and resolution. Adaptive testing methods for managing silicon process variations and yield enhancement are becoming increasingly important with shrinking design and profit margins in chips manufactured in advanced CMOS technologies.
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Bhushan, M., Ketchen, M.B. (2015). Electrical Tests and Characterization in Manufacturing. In: CMOS Test and Evaluation. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-1349-7_7
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DOI: https://doi.org/10.1007/978-1-4939-1349-7_7
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