Abstract
In this chapter we illustrate the applications of surface electron microscopy with slow electrons by examples selected from the extensive list of references, which should be accessible to most readers. The list has no claim to completeness, in particular because some important results have been published only in conference proceedings, which are hard to find, and some in the open literature may have been overlooked. Many application examples have already been mentioned in Chap. 3 in connection with the description of the methods and will not be repeated here. The examples are ordered primarily according to the material studied, an imperfect ordering system because certain phenomena are studied using several materials. This will become evident already in the first section, which is concerned with the microstructure of surfaces, studied on metals, semiconductors, and insulators. All methods, which contribute to the understanding of a given phenomenon will be discussed in the corresponding section to illustrate their complementarity whenever existing. Every method has its strengths and limitations and accordingly will dominate the various chapters. For example, LEEM is ideally suited for the study of the microstructure of surfaces and of processes that influence it, while of only limited use for the study of the surface composition. On the other hand, XPEEM gives little information on the microstructure but is powerful in chemical characterization. Some of the other methods such as MIEEM provide very limited information but will nevertheless be mentioned whenever they have been used in a given context.
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References
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Bauer, E. (2014). Applications in Surface Science. In: Surface Microscopy with Low Energy Electrons. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-0935-3_5
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