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Instrumentation

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Surface Microscopy with Low Energy Electrons

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Abstract

This chapter describes the instruments used in emission and reflection microscopy starting from the simplest configuration to the most sophisticated instruments. These include aberration-corrected microscopes and microscopes which allow spectroscopic and spin-resolved imaging; time-resolved imaging too will be discussed briefly. Next, the components used in them are discussed: objective lens and other axial symmetric lenses, beam separators, electron mirrors, aberration correction, energy filters, Wien filters, spin polarizers, stigmators/deflectors, apertures, photon sources, electron sources, image detection, and specimen manipulation. Other instrumentation aspects such as vacuum generation, airlock and preparation chamber, electronics, and computer control/operational procedures will only briefly be touched upon.

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    Ernst Bauer

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Bauer, E. (2014). Instrumentation. In: Surface Microscopy with Low Energy Electrons. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-0935-3_3

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