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Surface Microscopy with Low Energy Electrons pp 21–88Cite as

Basic Interactions

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Abstract

Understanding the interactions of photons and slow electrons with condensed matter is fundamental for the understanding of the imaging process in emission and reflection electron microscopy with slow electrons. While some of these interactions are common to both emission and reflection imaging, such as the propagation of the electrons in the sample to its surface, there are fundamental differences between the two imaging modes. Following the historical evolution of surface imaging with slow electrons, this chapter discusses first the processes involved in emission microscopy and then turns to those important in reflection microscopy with electrons entering the sample, i.e., to low energy electron microscopy (LEEM). In mirror electron microscopy the incident beam does not interact with the sample but only with the field modification caused by the sample, which is a problem of electron optics and image formation and will be discussed in Chap. 4.

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Bauer, E. (2014). Basic Interactions. In: Surface Microscopy with Low Energy Electrons. Springer, New York, NY. https://doi.org/10.1007/978-1-4939-0935-3_2

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