Dynamic (Oscillographic) Method of Investigation

Abstract

As already indicated, one of the difficulties of studying secondary emission by the static method is the fact that, in the course of measurement, the target surface is required to remain clean, yet at the same time measuring the energy distribution of the secondary particles by the static method, i.e., taking one volt—ampere characteristic, is a long process, requiring several hours or more, and it is almost impossible to keep the surface clean for this period.