Abstract
The behaviour of He, Ne, Ar, Kr and Xe in UO2 has been investigated using the semi-classical Mott-Littleton simulation technique. The interactions of the gas atoms with the lattice show two extremes of behaviour characterised by the properties of Xe and He. Xenon is very insoluble—its retention in U02 is a consequence of the large activation energy necessary for diffusion (>3eV). The most stable solution site for Xe is a function of stoichiometry: in UO2-x, the solution energy is lowest at a tri-vacancy; in UO2, at a di-vacancy and in UO2+x, at a uranium vacancy. In comparison with xenon, helium is small and readily accommodated at either a defect or interstitial site (solution energy -0.1 eV). Despite this, in the perfect lattice, He exhibits a barrier of ~4eV to diffusion between interstitial sites. However, in the presence of defects, diffusion barriers are reduced to ~0.2eV. These results are discussed with respect to the range of vacancy and vacancy clusters (solution sites) of the type expected in a highly defective or radiation damaged material.
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Grimes, R.W. (1991). Simulating the Behaviour of Inert Gases in UO2 . In: Donnelly, S.E., Evans, J.H. (eds) Fundamental Aspects of Inert Gases in Solids. NATO ASI Series, vol 279. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-3680-6_36
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