Abstract
Microscopy is often used as an absolute method of particle size analysis since it is the only method in which the individual particles are observed and measured. It also permits examination of the shape and composition of particles with a sensitivity far greater than for any other technique. The representativeness of the sample under analysis is critical since measurements are carried out on such minute quantities. Sampling techniques and sample preparation should, therefore, be carefully considered and the statistical factors governing accuracy should be well known.
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References
Green, M. (1921), J. Franklin Inst., 192, 657.
Dunn, EJ. (1930), Ind. Engng. Chem., analyt. Edn, 2, 59.
Orr, C. and Dallevalle, J.M. (1959), Fine Particle Measurement, Macmillan, NY.
Irani, R.R. and Callis, C.F. (1963), Particle Size, Wiley, NY.
Harwood, M.G. (1954), B.J. appl. Phys. suppl. 3, S193.
Rosinski, J., Glaess, H.E. and McCulley, C.R. (1956), Analyt. Chem., 28, 486.
Allen, R.P. (1942), Ind. Engng. Chem., analyt. Edn, 14, 92.
Lenz, F. (1954), Optik, 11, 524.
Ellison, J. McK. (1954), Nature, 179, 948.
Green, M. (1946), Ind. Engng. Chem., 38, 679.
Martin G. et al. (1923), Trans. Ceram. Soc., 23, 61; (1926), 25, 51; (1928), 27, 285.
Heywood, H. (1946), Trans. Inst. Min. Metall., 55, 391.
Feret, R.L. (1931), Assoc. Int. pour l’essai des Mnt. 2, Group D, Zurich.
Tomkieff, S.L. (1945), Nature, 155, 24.
Moran, P.A.P. (1944), Nature, 154, 490.
Herdan, G. (1960), Small Particle Statistics, Butterworths.
Steinheitz, A.R. (1946), Trans. Soc. Chem. Ind., 65, 314.
Crowl, V.T. (1961), Paint Res. Station, Teddington, Memorandum No. 291, 12, 24.
Aschenbrenner, B.C. (1955), Photogrammetric Engng., 21, 376.
Walton, W.H. (1948), Nature, 162, 329.
Nicholson, W.L. (1976), J. Microsc., 107, 3, 323–4.
Timbrell, V. (1952), Nature, 170, 318–9.
Barnett, M.I. and Timbrell, V. (Oct., 1962), Pharm. J., 379.
Cauchy, A. (1840), C.R. Acad. Sci., Paris, 13, 1060.
Patterson, H.S. and Cawood, W. (1936), Trans. Faraday Soc., 32, 1084.
Watson, H.H. (1936), Trans. Inst. Min. Metall., 46, 176.
Fairs, G.L. (1943), Chemy Ind., 62, 374–8.
May, K.R. (1965), J. scient. Instrum., 22, 187.
Watson, H.H. (1952), B.J. Ind. Med., 19, 80.
Hamilton, R.J. and Holdsworth, J.F. (1954), B.J. appl. Phys., suppl. 3, S101.
BS 3406 (1963) Part 4.
Endter, F. and Gebauer, H. (1956), Optik, 13, 87.
Heywood, H. (1946), Bull. Inst. Min. Metall., nos. 477, 478.
Watson, H.H. and Mulford, D.F. (1954), A particle profile test strip for assessing the accuracy of sizing irregularly shaped particles with a microscope. B.J. appl Phys., suppl. 3, S105.
Fairs, G.L., Discussion, ibid., S108.
Walton, W.H., Survey of the automatic counting and sizing of particles, ibid., S121.
Vick, F.A. (1956), Sci. Prog., 94, 176, 655.
Morgan, B.B. (1957), Automatic particle counting and sizing. Research (Lond.), 10, 271.
Taylor, W.K. (1954), An automatic system for obtaining particle size distributions with the aid of the flying spot microscope. B.J. appl. Phys., suppl. 3, S173.
Roberts, F. and Young, J.Z. (1952), Nature, 169, 962.
Bell, H.A. (1954), Stages in the development of an arrested scan type microscope particle counter. B.J. appl Phys., suppl. 3, S156.
Mullard Film Scanning Particle Analyser, L. 188, Mullard Ltd, Technical Leaflet.
Crowl, V.T. (1960). The use of the Mulliard film scanning particle size distribution counting from electron micrographs. Res. Mem. No. 284, Research Association of British Paint, Colour and Varnish Manufacturers.
Causley, D. and Young, J. (1955), Z. Res. 8, 430.
Furmidge, C.G.L. (1961), B.J. appl. Phys., 12, 268.
Phillips, J.W. (1954), Some fundamental aspects of particle counting and sizing by linear scans. B.J. appl. Phys., suppl. 3, S133–7.
Hawksley, P.G.W., Theory of particle sizing and counting by track scanning, ibid., S125-32.
Casella Automatic Particle Counter and Sizer (Booklet 906A), Cooke, Troughton & Simms Ltd.
Allen, T. and Kaye, B.H. (1965), Analyst, 90, 1068, 147.
Walton, W.M. (1947), The application of the electron microscope to particle size measurement. Symp. Particle Size Analysis, Inst. Chem. Eng., 25, 64–76.
Fairs, G.L. (1951), J.R. microsc. Soc., 71, 209.
Dyson, J. (1960), J. opt. Soc. Am., 50, 754–7.
Payne, B.O. (1964), Microscope, 14, 6, 217.
Dyson, J. (1961), AEI Engng., 1, 13.
Becher, P. (1964), J. Colloid Sci., 19, 468.
Kay, D.H. (1965), Techniques for Electron Microscopy, 2nd edn. Blackwell Scientific Publications, Oxford.
Drummond, D.G. (ed.) (1950), The Practice of Electron Microscopy, Royal Microscopical Society, London.
Revell, R.S.M. and Agar, A.W. (1955), B.J. appl. Phys., 6, 23.
Bradley, D.E. (1954), B.J. appl Phys., 5, 65.
Backus, R.C. and Williams, R.C. (1950), J. appl. Phys., 21, 11.
Bradley, D.E. and Williams, D.J. (1957), J. gen. Microbiol., 17, 75.
Bailey, G.W. and Ellis, J.R. (1954), Microscope, 14, 6, 217.
Williams, R.C. and Wyckoff, R.W.G. (1946), J. appl Phys., 17, 23.
Cartwright, J. and Skidmore, J.W. (1953), Report No. 79, SMRE Sheffield.
Crowl, V.T. (1961), Report No. 291, Paint Research Station, Teddington.
Joffe, A.D. (1963), B.J. appl. Phys., 14, 7, 429.
Maclay, W.N. and Grindter, E.M. (1963), J. Colloid Sci., 18, 343.
Charman, W.N. (1961), Ph.D. Thesis, London Univ.
Taylor, N.J. (1969), Vacuum, 19, 575; J. Vacuum Sci. Tech. (1969), 6, 241.
Chang, C.C. (1971), Surface Sci., 25, 23.
Brundle, C.R. (1972), Surface and Defect Properties of Solids, 6, Ch. 6, Chem. Soc., London.
Rowe, S.H. (1966), Microscope, 15, 216.
Welford, G.A. (1960), Optics in Metrology, 85.
Timbrell, V. (1972), J. appl Phys., 43, 11, 4839.
Timbrell, V. (1972), Microscope, 20, 365.
Timbrell, V. (1973), Harold Heywood Memorial Symposium, Loughborough Univ., England.
Fairs, G.L. (1951), J.R. microsc, Soc., 71, 209.
Guruswamy, S. (1967), Particle Size Analysis, Soc. Analyt. Chem., 29–31.
Chatfield, E.J. (1967), J. scient. Instrum. 44, 615.
Lark, P.D. (1965), Microscope, 15, 1–6.
Krumbein, W.C. (1934), J. Sediment. Petrol., 4, 65–7.
Dyson, J. (1959), Nature, 184, 1561.
Davies, R. (1970), Illinois State Microscopical Society Seminar.
Jesse, A. (1971), Microscope, 19, 1, 21–30.
Cole, M., ibid., 87–103.
Huna, W., ibid., 2, 205–18.
Williams, G. (1971), Bull. Soc fr. Ceram. 90, 59–63.
Stutzer, M., ibid., 65–68.
Amor, A.F. and Block, M. (1968), J.R. microsc. Soc., 88, 4, 601–5.
Hamilton, R.J. and Phelps, B.A. (1956), B.J. appl. Phys. 7, 186.
Pidgeon, F.D. and Dodd, C.G. (1954), Analyt. Chem., 26, 1823–8.
McCrone, W.C. (1970), Microscope, 18, 1, 1.
Delly, J.G. (1969), Microscope, 17, 205–11.
Corcoran, J.F. (1970), Fuel, 49, 3, 331–4.
Eckert, J.J.D. and Caveney, R.J. (1970), J. Phys. E., 413–14.
Nathan, I.F., Barnett, M.I. and Turner, T.D. (1972), Powder Technol., 5, 2, 105–10.
Anon. (1967), Ceramic Age, December.
Barbery, G. (1974), Powder Technol., 9, 5/6, 231–40.
Sahu, B.K. (1976), Powder Technol., 13, 295–6.
Ellison, J. McK. (1954), Nature, 173, 948.
Eckhoff, R.K. and Enstad, G. (1915), Powder Technol., 11, 1–10.
Proctor, T.D. and Harris, G.W. (1974), J. Aerosol. Sci., 5, 1, 81–90.
Proctor, T.D. and Barker, D., ibid., 91–9.
Hay, W. and Sandberg, P. (1967), Micropaleontology, 13, 407–18.
Krinsley, D. and Margolis, S. (1969), Trans. N. Y. Acad. Sci., 31, 457–77.
Willard, R.J. and Hjelmstad, K.E. (1969/70), Powder Technol. 3, 311–13.
Turner, G.A., Fayed, E. and Zackariah, K. (1972), Powder Technol., 6, 33–37.
White, E.W. et al., (1970), Proc. 3rd Ann. Scanning Electron Microscope Symp., Illinois Institute of Technology Res. Inst., Chicago, pp. 57–64.
Duncan, A.A. (1974), Report MH SMP-74-19-F. Dept. NTIS, USA 7 pp.
Hallworth, G.W. and Barnes, P. (1974), J. Pharm. Pharmac., Suppl. 26, 78–79.
ASTM (1976), Annual Book of Standards, Part 41, Particle Size Measurement, Microscopy, E20–68 (Reapproved 1974).
Exner, H.E. and Linck, E. (1977), Powder Metall. Int., 9, 3, 131–3.
Morton, R.R.A., Measurement and Analysis of Electron Beam Microscope Images, Form 7050, Bausch and Lomb.
Morton, R.R.A. and Martens, A.E. (1972), Res. Develop., 23, 1, 24–26, 28.
Gahm, J. (1975), Spec. Iss. Pract. Metall., 5, 29–46, Dr Riederer, Stuttgart.
Gahm, J. (1975), Spec. Iss. Res. Film, 8, 6, 553–68.
Gahm, J. (1975), Fortschr. Minerol. 53, 1, 79–128.
Walton, W.H. (1947), Trans. Inst. Chem. Engrs, Suppl. 25, 64.
Dullien, F.A.L., Rhodes, E. and Schroeter, S.R. (1969/70), Powder Technol., 3, 124–35.
Dullien, F.A.L. and Mehta, P.N. (1972), Powder Technol., 5, 179–94.
Dullien, F.A.L. (1973), Am. Chem. Soc. Div. Org. Coat. Plast. Chem. Pap. 33, 2, 516–24.
Dullien, F.A.L. and Dhawan, G.K. (1974), J. Colloid Interfac. Sci., 47, 2, 337–49.
Szalkowski, F.J. (1977), J. Colloid Interfac. Sci., 58, 2, 199–215.
Perry, R.W., Harris, J.E.C. and Scullion, H.J. (1977), In: Particle Size Analysis Conf. (ed. M.J. Groves) Chem. Soc. Anal. Div., (1978), Heyden.
Morton, R.R.A. and McCarthy, C. (1975), Microscope, 23, 4, 239–60.
Davies, R. (1972), Leitz-Nutteilung. Wiss., U. Techn. Suppl. 1, 3, 65–74.
Alliet, D.F., Tietjen, T.A. and Wood, D.H. (1977), In: Particle Size Analysis Conf. (ed. M.J. Groves) Chem. Soc. Anal. Div., (1978), Heyden.
Anon. (1975), Microscope, 23, 2, VI and VII.
Jesse, A. (1976), Automatic image analysis; Bibliography (1973–1975); 676 References, ibid., 24, 1, 1–95.
Chu, Y.F. and Ruckenstein, E. (1976), J. Catalysis, 41, 3, 373–83.
Ruzek, J. and Zbuzek, B. (1975), Silikaty, 19, 1, 49–66.
Anon. (1978), Powder Metall Int., 10, 2, 95.
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Allen, T. (1981). Microscopy. In: Particle Size Measurement. Powder Technology Series. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-3063-7_6
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