Low-Temperature Scanning Electron Microscopy

Abstract

The scanning electron microscope (SEM) is primarily associated with the examination of the surfaces of specimens. In this chapter we will be concerned with the ways the SEM can be used to obtain information about the surfaces of frozen specimens that retain a substantial part of their natural water content. The low-temperature scanning electron microscope (LTSEM) is frequently used as the primary instrumentation for x-ray analytical studies, and many of the preparative techniques discussed here are common to both procedures. The analytical aspects will be considered in in the next chapter. As was the case in the previous chapter, on low-temperature transmission microscopy, it is not proposed to discuss the use of the SEM at ambient temperatures for the examination of specimens prepared by low-temperature methods.