Abstract
Infrared spectrometry and microscopy were combined in the late 1940s when all-reflective objectives became available(1,1a); these also served as condensers. When the entire microscopical system was made to transmit the infrared spectrum, spectroscopists developed FT-IR microscopy,(2) which allowed them to analyze samples in the milligram range. Accordingly, FT-IR microscopy became highly developed in the 1980s and 1990s.(3–8) However microscopists, who routinely work with subnanogram samples,(3) lately have found applications for what they may term IR microscopy.(2)
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© 1994 Springer Science+Business Media New York
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Rochow, T.G., Tucker, P.A. (1994). Fourier Transform Infrared Microscopy. In: Introduction to Microscopy by Means of Light, Electrons, X Rays, or Acoustics. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-1513-9_13
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DOI: https://doi.org/10.1007/978-1-4899-1513-9_13
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