Abstract
Complex leaky modes on printed circuit lines have been analyzed using approximate techniques [1], Wiener-Hopf techniques [2], Mode-matching [3] and spectral domain integral techniques [4] -[9]. The method of moments (MoM) in the spectral domain is a very general formulation, providing a straightforward technique for obtaining the dispersion relation of the line. This relation is obtained as an implict equation whose solutions are the zeros of a given function of the spectral variable. In this paper, we will analyze both the MoM technique for obtaining this equation in covered and uncovered microstrip lines and the equation itself. Special attention will be devoted to study the possible location and evolution of the solutions in the complex plane. This analysis will provide guidelines for the search of the leaky modes of printed lines. It would be also useful as a previous step towards a rigorous 3-D spectral domain analysis of the practical excitation of leaky modes by physical sources.
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© 1997 Springer Science+Business Media New York
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Marqués, R., Mesa, F. (1997). 2-D Integral Spectral Domain Analysis of Leaky Modes in Covered and Uncovered Microstrip Lines. In: Das, N.K., Bertoni, H.L. (eds) Directions for the Next Generation of MMIC Devices and Systems. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-1480-4_34
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DOI: https://doi.org/10.1007/978-1-4899-1480-4_34
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4899-1482-8
Online ISBN: 978-1-4899-1480-4
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