Data Processing for AES and XPS
In common with the vast majority of current analytical instrumentation, almost all surface analysis instruments in use in industrial or analytical laboratories are under computer control and data are acquired and stored in digital form. The result is an increased output and a saving of skilled operator time. However, there is a risk, particularly in fully automated systems, that the operator loses touch with what is actually happening in the machine and may fail to recognise erroneous or meaningless results.
KeywordsBackground Subtraction Electron Spectroscopy Laboratory Information Management System Auger Peak Photoelectron Peak
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