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Data Processing for AES and XPS

  • Graham C. Smith
Part of the Updates in Applied Physics and Electrical Technology book series (UAPE)

Abstract

In common with the vast majority of current analytical instrumentation, almost all surface analysis instruments in use in industrial or analytical laboratories are under computer control and data are acquired and stored in digital form. The result is an increased output and a saving of skilled operator time. However, there is a risk, particularly in fully automated systems, that the operator loses touch with what is actually happening in the machine and may fail to recognise erroneous or meaningless results.

Keywords

Background Subtraction Electron Spectroscopy Laboratory Information Management System Auger Peak Photoelectron Peak 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1994

Authors and Affiliations

  • Graham C. Smith
    • 1
  1. 1.Shell Research Ltd.ChesterEngland

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