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Internal Reflection Spectroscopy

  • Chapter
Surface Infrared and Raman Spectroscopy

Part of the book series: Methods of Surface Characterization ((MOSC,volume 3))

Abstract

When a beam of light is incident at an angle of incidence, φ1, on a plane interface from a transparent medium 1, part of the light is reflected at the interface and travels back in the plane of incidence, as shown in Fig. 1. In this specular or regular reflection, the angle of reflection equals the angle of incidence. If medium 1 is optically denser than medium 2, i. e., n 1 > n 2, this reflection is called internal reflection.

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Authors and Affiliations

  1. Tohoku University, Tsuchiura, Japan

    Professor W. Suëtaka

  2. Surface Science Center, University of Pittsburgh, Pittsburgh, Pennsylvania, USA

    John T. Yates Jr.

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Suëtaka, W., Yates, J.T. (1995). Internal Reflection Spectroscopy. In: Surface Infrared and Raman Spectroscopy. Methods of Surface Characterization, vol 3. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-0942-8_3

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