A Physical Model for the Observed Dependence of the Metal-Semiconductor Work Function Difference on Substrate Orientation

  • Hisham Z. Massoud
  • James D. Plummer


The metal-semiconductor work function difference Ø ms in the Al—SiO2—Si system has been measured using capacitance-voltage (C-V) measurements, and it was found to be orientation dependent, with the (100) orientation having a Ø ms larger than that of (111) by — 0.250 V. This result is in agreement with previous studies which showed that Ø ms is both orientation and processing dependent. These observations are interpreted in terms of the contribution of dipole moments resulting from partial charge transfer in interface bonds to the Ø ms . Such charge transfer takes place in bonds at the Si—SiO2 and gate—SiO2 interfaces and in their vicinity. The contribution of these dipole moments to the measured Ø ms has been calculated from first principles, and the results predict the orientation dependence of Ø ms , and provide a physical model for further investigating its processing dependence. Measurements and process modeling of charge components in metal-oxide-semiconductor (MOS) devices will be discussed.


Interface Bond Substrate Orientation Substrate Doping Partial Charge Transfer Interface Dipole 
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Copyright information

© Springer Science+Business Media New York 1988

Authors and Affiliations

  • Hisham Z. Massoud
    • 1
  • James D. Plummer
    • 2
  1. 1.Department of Electrical EngineeringDuke UniversityDurhamUSA
  2. 2.Center for Integrated SystemsStanford UniversityStanfordUSA

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