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Low Voltage Scanning Electron Microscopy (LVSEM) for Improved Surface Characterization of Ocular Implants and Other Prosthetic Devices

  • E. P. Goldberg
  • M. Yalon
  • W. E. Longo

Abstract

Surgical manipulation of plastic prostheses with metal instruments may produce surface damage which could compromise the biocompatibility of implants by tissue irritation or increase cellular and pathogen adhesion. However, there are little data concerning such manipulative damage. This paper reports the use of low voltage SEM (LVSEM) for examination of plastic device surfaces before and after normal surgical manipulation. Conventional versus low voltage SEM experiments clearly indicate that standard surgical procedures can produce severe implant surface damage which is not detected by normal SEM. However, LVSEM has been shown to visualize such surface damage readily. These results may have very important implications for improved prosthetic devices, instruments, and implant surgery.

Keywords

Surface Damage Intraocular Lens Surgical Manipulation Prosthetic Device Device Surface 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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References

  1. 1.
    E. P. Goldberg, et al., Materials Res. Soc. Symposium Proc., 110, 355 (1989).CrossRefGoogle Scholar

Copyright information

© Springer Science+Business Media New York 1990

Authors and Affiliations

  • E. P. Goldberg
    • 1
  • M. Yalon
    • 1
  • W. E. Longo
    • 2
  1. 1.Biomedical Engineering Center, Department of Materials Science & EngineeringUniversity of Florida, MAE217GainesvilleUSA
  2. 2.Materials Analytical Services, Inc.AtlantaUSA

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