Abstract
This paper deals with the detection of straight-line segments using the Hough transform. An alternative definition of straight line segments is given according to the nature (continuous or discrete) of image and parameter space and an effective algorithm for connectedness analysis is developed and evaluated. The algorithm involves an effective way of scanning the image for each detected peak which requires only additions and comparisons during its execution. It is verified for a simple image that its execution time, of O(N 2), is only a small fraction of that required by the standard Hough transform calculation.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
J. Illingworth and J. Kittler, “A survey of the Hough transform”, Comp. Vision, Graph, and Image Proc, Vol. 44, pp. 87–116, 1988.
R. O. Duda and P. E. Hart, “Use of Hough transformation to detect lines and curves in pictures”, Comm. ACM, Vol. 15, pp. 11–15, 1972.
L. da F. Costa, D. Ben-Tzvi and M. B. Sandler, “Performance improvements to the Hough transform”, in Proc. UK IT 90 Conference, Southampton, UK, pp. 98-103, Mar. 1990.
L. da F. Costa and M. B. Sandler, “Performance improvements and performance evaluation of the binary Hough transform”, in Proc. V European Signal Processing Conference (edited by L. Torres, E. Masgrau and M. Lagunas), Barcelona, Spain, pp. 693-696, Sep. 1990.
L. da F. Costa and M. B. Sandler, “A binary Hough transform and its efficient implementation in a systolica array architectures”, Pattern Recognition Letters, Vol. 10, pp. 329–334, 1989.
T. Risse, “Hough transform for line recognition: complexity of evidence accumulation and cluster detection”, Comp. Vision, Graph., and Image Proc, Vol. 46, 327–345, 1989.
L. Dorst and A. W. M. Smeulders, “Discrete representation of straight lines”, IEEE Trans PAMI, Vol. PAMI-6, pp. 450–462, 1989.
D. B. Shu, C. C. Li, J. F. Mancuso and Y. N. Sun, “A line extraction method for automated SEM inspection of VLSI resist”, IEEE Trans PAMI, Vol. 10, pp. 117–120, 1988.
L. da F. Costa and M. B. Sandler, “Implementation of the binary Hough transform in pipelined multi-transputer architectures”, in Proc. Transputer Appls. 1990, Southampton, UK, pp. 150-155, Jul. 1990.
C. Dambra, S. B. Serpico and G. Vernazza, “A new technique for peak detection in the Hough transform parameter space”, in Proc. V European Signal Proc. Conf, Barcelona, Spain, pp. 705-708, Sep. 1990.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1992 Springer Science+Business Media New York
About this chapter
Cite this chapter
da F. Costa, L., Sandler, M.B. (1992). Detecting Digital Straight Line Segments in O(N 2). In: Arcelli, C., Cordella, L.P., di Baja, G.S. (eds) Visual Form. Springer, Boston, MA. https://doi.org/10.1007/978-1-4899-0715-8_17
Download citation
DOI: https://doi.org/10.1007/978-1-4899-0715-8_17
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4899-0717-2
Online ISBN: 978-1-4899-0715-8
eBook Packages: Springer Book Archive