Characterization of CMOS Process Variations by Measuring Subthreshold Current

  • Aleksandra Pavasović
  • Andreas G. Andreou
  • Charles R. Westgate

Abstract

Analog integrated circuit performance depends on the matching characteristics of individual components; transistors, resistors or capacitors. For example, in a current mirror, two identically biased transistors that are designed to have the same geometry, are said to be matched if their drain currents are equal. Transistor mismatch is one of the more acute problems in the advancement of analog VLSI collective computational systems [1].

Keywords

Threshold Voltage Drain Current Test Chip Subthreshold Region Analog VLSI 
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Copyright information

© Springer Science+Business Media New York 1991

Authors and Affiliations

  • Aleksandra Pavasović
    • 1
  • Andreas G. Andreou
    • 1
  • Charles R. Westgate
    • 1
  1. 1.Department of Electrical and Computer EngineeringThe Johns Hopkins UniversityBaltimoreUSA

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