Scanning Probe Microscopy and Nanotechnology

  • Victor A. Bykov
Part of the Electronics and Biotechnology Advanced (EL.B.A.) Forum Series book series (ELBA, volume 2)


It is presently a well-known fact (Adam, 1941; Blinov, 1988) that LB-films can be utilized as materials for biosensors (Petty, 1991), gate dielectrics for MOS technology (Matveeva and Bokov, 1992), high resolution plasma etching e-beam- and photo-resists for micro- and submicro-electronics (Matveeva and Bokov, 1992), pyroelectric sensors. LB-film materials with the properties of conductors (Troitsky, 1991), superconductors, semiconductors, dielectrics of various quality parameters are already available. LB-films are an extremely interesting object for the scanning probe microscopy (SPM) as well as for scanning tunneling (STM) and atomic force microscopy (AFM).


Scan Probe Microscopy Scanning Tunneling Microscopy Image High Oriented Pyrolytic Graphite Monomolecular Layer Pyroelectric Sensor 
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  1. Adam, N.K., 1941, The Physics and Chemistry of Surfaces.Google Scholar
  2. Adamson, A.W., 1976, Physical Chemistry of surfaces Third Edition. A.Wiley-Interscience publication. N.Y., London, Sydney, Toronto.Google Scholar
  3. Alexeev, A.S., Valiansky, S.I., Savransky, V.V., 1992, ICPAS materials 8: 209–214.Google Scholar
  4. Berzina T.S., Troitsky V.I., Neilands O. Ya., Sudmale I. V., Nicolini C., 1995, Thin Solid Films 256: 186–191CrossRefGoogle Scholar
  5. Binnig, G., Rohrer, H., 1982, Helv.Phys.Acta 55: 726.Google Scholar
  6. Binnig, G., Quate, C.F., Gerber, Ch., 1986, Phys.Rev.Lett. 56: 930.PubMedCrossRefGoogle Scholar
  7. Blinov, L.M., 1988, Usp. Phis. Nauk (Russ.) 155:443–480.Google Scholar
  8. Bykov, V.A., Belyev, A.V., Eremchenko, M.D., Jgijgimontov, V.V., Ikonnikov, A.V., Katsour, S.F., Redchenko, V.V., Saounin, S.A., 1995, Industrial microelectronics (Russ.) in press.Google Scholar
  9. Bykov, V.A., Emelynov, A.V, Poltoratsky, W.A., Samsonov, N.S., 1994, Industrial microelectronics (Russ.) 1Google Scholar
  10. Bykov, V.A., Redchenko, V.V., Eremchenko, M.D., Ivanov, V.A., Mjagkov, I.V., 1993, Abstracts of Int. Conf. of scanning tunneling microscopy STM-93.Beijing, China, p. 196.Google Scholar
  11. Bykov, V.A., Redchenko, V.V., Shikin, S.A., Eremchenko, M.D., Novak, V.R., Mjagkov, I.V., 1993, Abstracts of Int. Conf. of scanning tunneling microscopy STM-93. Beijing, China, p. 197.Google Scholar
  12. Matveeva, N.K., and Bokov, Y.S., 1992, Thin Solid Films 210 /211: 477–479.CrossRefGoogle Scholar
  13. Matveeva, N.K., 1995, Thin Solid Films in press.Google Scholar
  14. Myagkov, I.V., 1989, Letters to the JTP (Russ.) 15: 15–18Google Scholar
  15. Myagkov, I.V., Novak, V.R., Lvov, Y.M., Tetemik, G.A., 1989, Second Int.Conf. “Molecular Electronics and Biocomputers”, abstracts, Moscow, USSR, p. 89–90.Google Scholar
  16. Petty, M.C., 1991, J.Biomed.Eng. 13: 209–214.PubMedCrossRefGoogle Scholar
  17. Roberts, G.G., 1989, Ferroelectrics 91: 21–38.CrossRefGoogle Scholar
  18. Roberts, G.G., 1990, “Langmuir-Blodgett Films”, Plenum Press, New York.Google Scholar
  19. Troitsky, V.I., 1991, Macromol. Chem., Macromol. Symp. 46: 223–227.Google Scholar

Copyright information

© Springer Science+Business Media New York 1996

Authors and Affiliations

  • Victor A. Bykov
    • 1
  1. 1.Zelenograd Research Institute for Physical ProblemsCorporation MDTMoscowRussia

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