APES: An Evaluation Environment of Fault-Tolerance Capabilities of Array Processors
Design of VLSI and WSI array processors, a class of complex architectures, cannot avoid a detailed study of the fault/defect tolerance characteristics to prevent a consistent reduction of the production yield and a short functioning life of devices. These problems become particularly important when the application is critical and maintenance is difficult or impossible. In the APES environment some tools are available to evaluate statistically the the fault-tolerance capabilities of array processors and to simulate the behavior of such structures when faults occur.
KeywordsFault Injector Array Processor Fault Distribution Fault Occurrence Array Architecture
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