Investigation of Free-Carrier Scattering in Semiconductors Using Coherent Spectroscopy

  • Jagdeep Shah
  • Dai-Sik Kim
Part of the NATO ASI Series book series (NSSB, volume 330)

Abstract

Scattering of free carriers by phonons, free carriers and coupled plasmon-phonon modes is of fundamental interest in solid state physics, and also of interest in semiconductor devices such as bipolar transistors. Investigations of the rate of energy loss of high energy electrons incident on thin metallic films date back to 1930 [1, 2]. In more recent times scattering processes of free carriers, excitons and other excitations in semiconductors have been investigated by studying their relaxation dynamics with ultrafast lasers. There are a number of recent reviews of these ultrafast studies in semiconductors and their nanostructures [3, 4].

Keywords

Free Carrier Laser Spectrum Excitation Density Intervalley Scattering Excitation Photon Energy 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1994

Authors and Affiliations

  • Jagdeep Shah
    • 1
  • Dai-Sik Kim
    • 1
  1. 1.AT&T Bell LaboratoriesHolmdelUSA

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