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Catalyst Characterization pp 509–558Cite as

Characterization of Catalysts by Conventional and Analytical Electron Microscopy

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Part of the book series: Fundamental and Applied Catalysis ((FACA))

Abstract

Heterogeneous catalysts usually consist of highly divided solid phases that are closely interconnected and thus difficult to characterize. Conventional transmission electron microscopy (CTEM) offers the unique advantages of allowing the direct observation of catalyst morphology with a resolution tunable in the range 10−4–10−10 m and of obtaining structural information by lattice imaging and microdiffraction techniques. Moreover, scanning transmission electron microscopes (STEM) equipped with X-ray analyzers can be used to determine the local composition of catalysts with a spatial resolution as good as 1 nm in the case of field emission gun STEM. This is why electron microscopy is now in widespread use for catalyst characterization.

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Authors and Affiliations

  1. Institute de Recherches sur la Catalyse, CNRS, Villeurbanne, France

    P. Gallezot & C. Leclercq

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  1. P. Gallezot
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  2. C. Leclercq
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Editors and Affiliations

  1. Late of Institut de Recherches sur la Catalyse, CNRS, Villeurbanne, France

    Boris Imelik  & Jacques C. Vedrine  & 

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Gallezot, P., Leclercq, C. (1994). Characterization of Catalysts by Conventional and Analytical Electron Microscopy. In: Imelik, B., Vedrine, J.C. (eds) Catalyst Characterization. Fundamental and Applied Catalysis. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9589-9_19

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  • DOI: https://doi.org/10.1007/978-1-4757-9589-9_19

  • Publisher Name: Springer, Boston, MA

  • Print ISBN: 978-1-4757-9591-2

  • Online ISBN: 978-1-4757-9589-9

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