Abstract
With the recent developments of scanning probe microscopes (SPMs), there has been a growth of knowledge about the surfaces of magnetic recording devices. The topography of various mass storage media has been examined in terms of roughness as well as identifying features of the surface. Magnetic track widths and bit widths have been observed and measured showing the differences in resolution as a function of lift height of the magnetic probe. The gap width, surface smoothness and other features of magnetic recording heads have been measured.
The exploding growth of the capabilities of scanning probe microscopes are making these instruments increasingly valuable in research, development, and manufacture of magnetic recording products.
This is a preview of subscription content, log in via an institution to check access.
Access this chapter
Tax calculation will be finalised at checkout
Purchases are for personal use only
Preview
Unable to display preview. Download preview PDF.
References
G. Binnig, H. Rohrer, C. Gerber, and E. Weibel, Surface study by scanning tunneling microscopy, Phys. Rev. Lett., 49: 57–60 (1982).
G. Binnig, C.F. Quate, and C. Gerber, Atomic force microscope, Phys. Rev. Lett., 56: 930–933 (1986).
T.L. Altshuler, Atomic-scale materials characterization, Adv. Mater. Process., 130, No. 3: 18–23 (1991).
R. Allenspach, H. Salemink, M. Bischof, and E. Weibel, Tunneling experiments involving magnetic tip and magnetic sample, Z. Phys. B. 67: 125–128 (1987).
U. Hartmann, T. Gäddenhenrich, H. Lemke, and C. Heiden, Domain-wall imaging by magnetic force microscopy, IEEE Trans. Magn. 26: 1512–1514 (1990).
Y. Martin and H.K. Wickramasinghe, Magnetic imaging by “force microscopy” with 1000 A resolution, Appl. Phys. Lett. 50, 20: 1455–1457 (1987).
P. Rice and J. Moreland, Tunneling-stabilized magnetic force microscopy of bit tracks on a hard disk, “ IEEE Trans. Magn. 27: 3452–3454 (1991).
E. Murdock, R. Simmons, and R. Davidson, Roadmap for 10 gbit/in2 recording media: challenges, IEEE Trans. Magn. 28: 3078–3083 (1992).
R. Gomez, A. Adly, I. Mayergoyz, and E. Burke, Magnetic force scanning tunneling microscopy: theory and experiment, IEEE Trans. Magn., 29: 2494–2499 (1993).
Digital Instruments Inc. (manufacturer): NanoScopeTM III Stand Alone MultiModeTM Atomic Force Microscope.
George Islay, Digital Equipment Corporation, 333 South Street, Shrewsbury, MA 01545.
Philip Bartels, Digital Equipment Corporation, 333 South Street, Shrewsbury, MA 01545.
Author information
Authors and Affiliations
Editor information
Editors and Affiliations
Rights and permissions
Copyright information
© 1997 Springer Science+Business Media New York
About this chapter
Cite this chapter
Altshuler, T.L. (1997). Application of Magnetic Force Microscopy in Magnetic Recording. In: Cohen, S.H., Lightbody, M.L. (eds) Atomic Force Microscopy/Scanning Tunneling Microscopy 2. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9325-3_24
Download citation
DOI: https://doi.org/10.1007/978-1-4757-9325-3_24
Publisher Name: Springer, Boston, MA
Print ISBN: 978-1-4757-9327-7
Online ISBN: 978-1-4757-9325-3
eBook Packages: Springer Book Archive