Application of Magnetic Force Microscopy in Magnetic Recording

  • Thomas L. Altshuler

Abstract

With the recent developments of scanning probe microscopes (SPMs), there has been a growth of knowledge about the surfaces of magnetic recording devices. The topography of various mass storage media has been examined in terms of roughness as well as identifying features of the surface. Magnetic track widths and bit widths have been observed and measured showing the differences in resolution as a function of lift height of the magnetic probe. The gap width, surface smoothness and other features of magnetic recording heads have been measured.

The exploding growth of the capabilities of scanning probe microscopes are making these instruments increasingly valuable in research, development, and manufacture of magnetic recording products.

Keywords

Scanning Probe Microscope Storage Medium Magnetic Force Microscope Lift Height Knoop Indentation 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1997

Authors and Affiliations

  • Thomas L. Altshuler
    • 1
  1. 1.Advanced Materials Laboratory, Inc.ConcordUSA

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