Nanometer-Scale Qualitative Analysis of Surfaces With a Modified Scanning Tunneling Microscope/ Field Emission Source

  • P. G. Van Patten
  • J. D. Noll
  • M. L. Myrick

Abstract

We have designed and constructed modifications to the scanning tunneling microscope that allow the bias voltage to be used as an excitation source for arc atomic emission spectroscopy. The purpose of this addition to the instrument is to allow unambiguous elemental analysis of species present on the surface. The light emitted from the arc across the tunneling gap is collected by appropriate means (such as optical fibers positioned in close proximity to the tip) and directed into a high resolution spectrometer for spectral analysis by a multichannel detector (such as a charge-coupled device (CCD) or photodiode array). Present progress includes completion of the hardware and software modifications to the instrument, verification of emission and verification that the light is substantively collected into optical fibers using a scheme described in this paper.

Keywords

Scan Tunneling Microscope Atomic Emission Spectroscopy Hardware Modification Highly Order Pyrolytic Graphite Analog Switch 
These keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves.

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Copyright information

© Springer Science+Business Media New York 1997

Authors and Affiliations

  • P. G. Van Patten
    • 1
  • J. D. Noll
    • 1
  • M. L. Myrick
    • 1
  1. 1.Department of Chemistry and BiochemistryUniversity of South CarolinaColumbiaUSA

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