Abstract
This paper presents a general description of the use of the ne tip-based proximal probes—scanning tunneling microscopy (STM) and atomic force microscopy (AFM)—to study the nanoscale properties of surfaces. Using STM, we have examined the nucleation and growth of C60 films on Au(111) and Ag(111). In addition to imaging, we have measured the charge transfer between the metal and C60 using STM in the spectroscopic mode. AFM studies which focus on developing quantitative methods for measuring surface forces and the mechanical properties of surfaces are also presented.
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References
Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques and Applications 1993,“ D.A. Bonnell, ed. VCH Publishers, Inc., New York, NY.
Methods of Experimental Physics, Scanning Tunneling Microscopy,“ J.A. Stroscio and J.W. Kaiser, eds., vol. 27, Academic Press, Inc., Boston, MA (1993).
E.I. Altman and R.J. Colton, Nucleation, growth and structure of fullerene films on Au(111), Surf. Sci. 279, 49–67 (1992).
E.I. Altman and R.J. Colton, Characterization of the interaction of C, with Au(111), in “Atomic and Nanometer Scale Modification of Materials: Fundamentals and Applications,” Ph. Avouris, ed., NATO ASI Series, Kluwer Academic Press, London 303–314 (1993).
E.I. Altman and R.J. Colton, The interaction of C, with noble metal surfaces, Surf. Sci., 295: 1333 (1993).
E.I. Altman, and R.J. Colton, Determination of the orientation of C, adsorbed on Au(111) and Ag(111), Phys. Rev. B48: 18244–9 (1993).
G. Binnig, C.F. Quate, and Ch. Gerber, Atomic force microscope, Phys. Rev. Lett. 56: 930 (1986).
C.M. Mate, G.M. McClelland, R. Erlandsson, and S. Chiang, Atomic-scale friction of a tungsten tip on a graphite surface, Phys. Rev. Lett. 59: 1942 (1987).
N.A. Burnham and R.J. Colton, Measuring the nanomechanical properties and surface forces of materials using an atomic force microscope, J. Vac. Sci. Technol. A7: 2906–13 (1989).
N.A.Burnham, D.D Dominguez, R.L Mowery, and R.J. Colton, Probing the surface forces of monolayer films with an atomic force microscope, Phys. Rev. Lett. 64: 1931–4 (1990).
N.A. Burnham, R.J. Colton, and H.M Pollock, Interpretation issues in force microscopy, J. Vac.Sci. Technol. A9: 2548–56 (1991).
N.A. Burnham, R.J. Colton, and H.M. Pollock,“ Interpretation of Force Curves in Force Microscopy, Nanotechnology,” vol. 4, 64–80 (1993)
N.A. Burnham and R.J. Colton, Force microscopy, in “Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques and Applications,” D.A. Bonnell, ed., VCH Publishers, Inc., New York, NY, 191–250 (1993).
N.A. Burnham, R.J. Colton, and H.M. Pollock, “Work Function Anisotropies as an Origin of Long-Range Surface Forces,” Phys. Rev. Lett. 69: 144–47 (1992).
S.M. Hues, R.J. Colton, E. Meyer, and H-J Giintherodt, Scanning probe microscopy of thin films, MRS Bulletin, 18: 41–49 (1993).
J.N. Israelachvili, “Intermolecular and Surface Forces,” Academic Press, Inc., New York, NY, 153 (1986).
U. Landman, W.D. Luedtke, N.A. Burnham, and R.J. Colton, Atomistic mechanisms and dynamics of adhesion, nanoindentation and fracture, Science 248: 454–61 (1990).
J.A. Harrison, D.W. Brenner, C.T. White, and R.J. Colton, Atomistic Mechanisms of Adhesion and Compression of Diamond Surfaces, Thin Solid Films 206: 213–19 (1991).
J.A. Harrison, R.J. Colton, C.T. White, and D.W. Brenner, Atomistic simulation of the Nanoindentation of diamond and graphite surfaces, Mat. Res. Soc. Symp. Proc. 239: 573–7 (1992).
J.A. Harrison, C.T. White, R.J. Colton, and D.W. Brenner, Nanoscale investigation of indentation, adhesion, and fracture of diamond (111) surfaces, Surf Sci. 271: 57–67 (1992).
J.A. Harrison, C.T. White, R.J. Colton, and D.W. Brenner, Molecular dynamics simulations of atomic-scale friction of diamond surfaces, Phys. Rev. B 46: 9700–8 (1992).
J.A. Harrison, C.T. White, R.J. Colton, and D.W. Brenner, Atomistic simulations of friction at sliding diamond interfaces, MRS Bulletin 18: 50–3 (1993).
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© 1994 Springer Science+Business Media New York
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Colton, R.J., Altman, E.I., Hues, S.M. (1994). Surface Science at the Nanoscale: Molecular Imaging and Surface Forces. In: Cohen, S.H., Bray, M.T., Lightbody, M.L. (eds) Atomic Force Microscopy/Scanning Tunneling Microscopy. Springer, Boston, MA. https://doi.org/10.1007/978-1-4757-9322-2_31
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DOI: https://doi.org/10.1007/978-1-4757-9322-2_31
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